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|z 9780128046470
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|z 0128046473
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|a 620.1/127
|2 23
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| 245 |
0 |
0 |
|a Atom probe tomography :
|b put theory into practice /
|c edited by Williams Lefebvre-Ulrikson, Fran�cois Vurpillot, Xavier Sauvage.
|
| 260 |
|
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|a London :
|b Academic Press,
|c 2016.
|
| 300 |
|
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|a 1 online resource
|
| 336 |
|
|
|a text
|b txt
|2 rdacontent
|
| 337 |
|
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|a computer
|b c
|2 rdamedia
|
| 338 |
|
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|a online resource
|b cr
|2 rdacarrier
|
| 500 |
|
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|a Includes index.
|
| 588 |
0 |
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|a Print version record.
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| 505 |
0 |
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|a Front Cover; ATOM PROBE TOMOGRAPHY#; ATOM PROBE TOMOGRAPHY PUT THEORY INTO PRACTICEED; Copyright; CONTENTS; CONTRIBUTORS; PREFACE; LIST OF ABBREVIATIONS; One -- Early Developments and Basic Concepts; Two -- Field Ion Emission Mechanisms; Three -- Basics of Field Ion Microscopy; Four -- Atom Probe Sample Preparation; Five -- Time-of-Flight Mass Spectrometry and Composition Measurements; Six -- Atom Probe Tomography: Detector Issues and Technology; Seven -- Three-Dimensional Reconstruction in Atom Probe Tomography: Basics and Advanced Approaches; Eight -- Laser-Assisted Field Evaporation.
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| 505 |
8 |
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|a Nine -- Data MiningTen -- Correlative Microscopy by (Scanning) Transmission Electron Microscopy and Atom Probe Tomography; Eleven -- Combining Atom Probe Tomography and Optical Spectroscopy; A; B; INDEX; Back Cover; INTRODUCTION; ATOM PROBE TOMOGRAPHY IN MATERIALS SCIENCE TODAY; BASIC CONCEPTS; CONCLUDING REMARKS, THE SPECIFICITIES OF ATOM PROBE TOMOGRAPHY; REFERENCES; INTRODUCTION; FIELD GENERATION AT THE SURFACE OF A FIELD EMITTER; FIELD EMISSION AT THE TIP SURFACE FROM ELECTRON EMISSION TO FIELD EVAPORATION; TRAJECTORIES OF IONS AFTER IONIZATION OR FIELD EVAPORATION IN THE ATOM PROBE.
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| 505 |
8 |
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|a Conclusionreferences; introduction; basic principles; field ion microscopy in materials science; conclusion; references; specimen preparation by electropolishing; sample preparation using focused ion beam milling; conclusions; references; introduction; general concepts and definitions; optimizing the mass spectrum in atom probe tomography; extracting information from mass spectra; references; introduction; microchannel plate assembly; conventional delay line detector; conventional measure of timing information; accuracy of conventional delay line detector for single events.
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| 505 |
8 |
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|a Coevaporation effectaccuracy of conventional delay line detector for multiple events; advanced delay line detector; influence of detection systems performances on low-angle atom probe accuracy; influence of detection systems on atom probe accuracy in wide-angle ap; effect of multiple events detection on composition; conclusion; references; classical methods of tomographic reconstruction; a few words on metrological performances and terminology; spatial precision; improving spatial accuracy of apt images; conclusions and perspectives; references; introduction.
|
| 505 |
8 |
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|a Historical background of field evaporation assisted by laser pulsesoptical properties of nano tips; physical mechanisms of field evaporation assisted by laser pulses; consequences on the la-apt performances; conclusions and perspectives; references; preliminary definitions; building the tools; relevance of the approach as a function of the feature of interest; identifying the bias; conclusion; references; motivations for a correlative approach; relevant techniques for a correlative approach; experimental protocols; degradation of specimen due to observation in stem.
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| 504 |
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|a Includes bibliographical references at the end of each chapters and index.
|
| 650 |
|
0 |
|a Tomography.
|
| 650 |
|
6 |
|a Tomographie.
|0 (CaQQLa)201-0049508
|
| 650 |
|
7 |
|a TECHNOLOGY & ENGINEERING
|x Engineering (General)
|2 bisacsh
|
| 650 |
|
7 |
|a TECHNOLOGY & ENGINEERING
|x Reference.
|2 bisacsh
|
| 650 |
|
7 |
|a Tomography
|2 fast
|0 (OCoLC)fst01152453
|
| 700 |
1 |
|
|a Lefebvre-Ulrikson, Williams.
|
| 700 |
1 |
|
|a Vurpillot, Fran�cois.
|
| 700 |
1 |
|
|a Sauvage, Xavier.
|
| 776 |
0 |
8 |
|i Print version:
|a Lefebvre, Williams.
|t Atom Probe Tomography : Put Theory Into Practice.
|d : Elsevier Science, �2016
|z 9780128046470
|
| 856 |
4 |
0 |
|u https://sciencedirect.uam.elogim.com/science/book/9780128046470
|z Texto completo
|
