Cargando…
Chemical imaging analysis /
Chemical Imaging Analysis covers the advancements made over the last 50 years in chemical imaging analysis, including different analytical techniques and the ways they were developed and refined to link the composition and structure of manmade and natural materials at the nano/micro scale to the fun...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Amsterdam, Netherlands :
Elsevier,
[2015]
|
| Colección: | Comprehensive analytical chemistry ;
v. 69. |
| Temas: | |
| Acceso en línea: | Texto completo Texto completo |
Tabla de Contenidos:
- Front Cover; Advisory Board; Chemical Imaging Analysis; Copyright; Contents; Series Editor's Preface; Preface; Chapter 1
- Chemical Imaging Introduction; 1.1 INTRODUCTION; 1.2 SEMICONDUCTORS
- MICROELECTRONICS; 1.3 ANALYTICAL CHEMISTRY AND NANOANALYSIS; 1.4 CONCLUSIONS; REFERENCES; Chapter 2
- Spatially Confined Analysis; 2.1 INTRODUCTION; 2.2 CHEMICAL IMAGING ANALYSIS; 2.3 POINT ANALYSIS AND 2-D IMAGING ANALYSIS; 2.4 SURFACE ANALYSIS, ELECTRON SPECTROSCOPY FOR SURFACE ANALYSIS; 2.5 DETECTION LIMITS, SENSITIVITY; 2.6 TECHNIQUES BASED ON INNER-SHELL EXCITATION.
- 2.7 STRUCTURAL ANALYSIS, ELECTRON AND X-RAY DIFFRACTION2.8 METROLOGY AT THE NANOLEVEL; 2.9 CONCLUSION; REFERENCES; Chapter 3
- History and Present Status of Micro- and Nano-Imaging Analysis; 3.1 INTRODUCTION; 3.2 BEAM AND PROBE TECHNIQUES; 3.3 MASS SPECTROMETRY; 3.4 OPTICAL SPECTROSCOPY; 3.5 X-RAY MICROSCOPY; 3.6 ELECTRON MICROSCOPY; 3.7 SURFACE SENSITIVE ELECTRON SPECTROSCOPY; 3.8 TECHNIQUES BASED ON MEGAELECTRONVOLT PROTONS AND OTHER HEAVY IONS; 3.9 CONCLUSION; REFERENCES; Chapter 4
- Nanotechnology and Analytical Chemistry; 4.1 INTRODUCTION; 4.2 NANOSTRUCTURAL MATERIALS.
- 4.3 DNA AND NANOTECHNOLOGY4.4 SPECTROSCOPIC EFFECTS; 4.5 DIMENSIONAL ASPECTS; 4.6 MICRO- AND NANO-ELECTRO-MECHANICAL SYSTEMS (MEMS, NEMS); 4.7 MINIATURISATION IN ANALYSIS; 4.8 BIOMIMETICS; 4.9 NANOTOXICOLOGY, ECOTOXICOLOGY; 4.10 CONCLUSIONS; REFERENCES; Chapter 5
- Mass Spectrometry and Chemical Imaging; 5.1 INTRODUCTION; 5.2 LASER ABLATION INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY; 5.3 SECONDARY ION MASS SPECTROMETRY; 5.4 FOURIER TRANSFORM LASER MICROPROBE MASS SPECTROMETRY; 5.5 ATOM PROBE MICROSCOPY. THE 3-D ATOM PROBE; 5.6 MOLECULAR IMAGING, MASS SPECTROMETRY IMAGING.
- 5.7 ACCELERATOR MASS SPECTROMETRY AND IMAGING ANALYSIS5.8 PROSPECTS AND CONCLUSION; REFERENCES; Chapter 6
- X-Ray Imaging; 6.1 INTRODUCTION; 6.2 X-RAY FOCUSSING; 6.3 SYNCHROTRON SOURCES; 6.4 X-RAY ANALYSIS AND IMAGING; 6.5 COHERENCE AND IMAGING; 6.6 EXAMPLES OF MICRO-CHARACTERISATION IN SR FACILITIES IN EUROPE; 6.7 QUANTITATIVE ANALYSIS AND IMAGING; 6.8 LABORATORY X-RAY IMAGING SYSTEMS; 6.9 CONCLUSIONS; REFERENCES; Chapter 7
- Electron-Based Imaging Techniques; 7.1 INTRODUCTION; 7.2 ELECTRON INTERACTION WITH MATTER; 7.3 ELECTRON MICROSCOPY AT THE ATOMIC LEVEL.
- 7.4 SCANNING ELECTRON MICROSCOPY, ELECTRON PROBE MICROANALYSIS7.5 CONCLUSIONS; REFERENCES; Chapter 8
- Particle-Based Imaging Techniques; 8.1 INTRODUCTION; 8.2 PARTICLE-SOLID INTERACTION; 8.3 ION BEAM ANALYSIS; 8.4 INSTRUMENTATION AND TECHNICAL ASPECTS; 8.5 HELIUM ION MICROSCOPY; 8.6 FOCUSSED ION BEAM SYSTEMS; 8.7 LARGE VOLUME COSMIC RAY TOMOGRAPHY; 8.8 CONCLUSIONS; REFERENCES; Chapter 9
- Spectroscopic Imaging; 9.1 INTRODUCTION; 9.2 SCANNING PROBE MICROSCOPY; 9.3 SPECTROSCOPIC IMAGING TECHNIQUES; 9.4 NONLINEAR OPTICAL MICROSCOPY; 9.5 NANOPARTICLES.