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Advances in imaging and electron physics. Volume 188 /
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Amsterdam, the Netherlands :
Academic Press,
2015.
|
| Colección: | Advances in Imaging and Electron Physics ;
188 |
| Temas: | |
| Acceso en línea: | Texto completo Texto completo |
MARC
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| 245 | 0 | 0 | |a Advances in imaging and electron physics. |n Volume 188 / |c edited by Peter W. Hawkes. |
| 264 | 1 | |a Amsterdam, the Netherlands : |b Academic Press, |c 2015. | |
| 300 | |a 1 online resource | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 0 | |a Advances in Imaging and Electron Physics ; |v 188 | |
| 504 | |a Includes bibliographical references and index. | ||
| 588 | 0 | |a Online resource; title from title details screen (ScienceDirect, viewed April 23, 2015). | |
| 505 | 0 | |a Front Cover; Advances in Imaging and Electron Physics; Copyright; Contents; Preface; Future Contributions; Contributors; Chapter 1: Pattern Generators for Reflective Electron-Beam Lithography (REBL); 1. Introduction; 2. REBL and DPG Basics; 3. Lenslet Analysis; 4. REBL Patterning Strategy and Column Optics; 5. Charge Draining; 6. DPG2 Design and Realization; 7. Example of Lithographic Results; 8. Innovations in DPG3; 9. Summary; Acknowledgments; References; Chapter 2: Recent Developments in Time-of-Flight Mass Spectrometry; 1. Introduction; 1.1. The Concept of a Time-of-Flight Analyzer | |
| 505 | 8 | |a 1.2. The Wiley-McLaren Ion Source1.3. The Reflectron; 2. Recent Development in Time-of-Flight Mass Spectrometry; 2.1. Progress Regarding Instrumentation; 2.1.1. Imaging Time-of-Flight Mass Spectrometry; 2.1.2. Multiturn and Multipass Time-of-Flight Mass Spectrometry; 2.1.3. Ion Mobility Spectrometry; 2.1.4. Single Photon Ionization; 2.2. Scientific Applications; 2.2.1. MALDI; 2.2.2. SIMS; 2.2.3. MATI; 2.2.4. Tandem Mass Spectrometry; 3. Outlook; References; Chapter 3: A Special Voice Transform, Analytic Wavelets, and Zernike Functions; 1. Introduction; 1.1. Affine Wavelets and Multiresolution | |
| 505 | 8 | |a 1.2. The Voice Transform2. The Hyperbolic Wavelet Transform; 2.1. The Blaschke Group; 2.2. Hardy Spaces; 2.3. The Continuous Voice Transform on H2(T); 3. Multiresolution in the Hardy Space of the Unit Disk; 3.1. Construction of Multiresolution in H2(T); 3.2. The Properties of the Projection Operator Corresponding to the nth Resolution Level; 3.3. Reconstruction Algorithm Using the Wavelet Base; 3.4. Discrete Orthogonality of the Hyperbolic Wavelet Basis; 4. Multiresolution in the Hardy Space of the Upper Half-plane; 4.1. Transition to the Upper Half-plane, Motivation | |
| 505 | 8 | |a 4.2. A Special Discrete Subset in the Upper Half-plane4.3. Multiresolution in the Hardy Space of the Upper Half-plane; 4.4. The Projection Operator Corresponding to the nth Resolution Level; 4.5. Reconstruction Algorithm; 5. Connection Between the Voice Transform, Zernike Polynomials and Applications; 5.1. The Zernike Polynomials; 5.2. The Matrix Elements of the Representation of the Blaschke Group; 5.3. Discrete Orthogonality of Complex Zernike Functions; 5.4. Zernike Moments, Applications; Acknowledgments; References | |
| 505 | 8 | |a Chapter 4: The Hankel Transform in n-dimensions and Its Applications in Optical Propagation and Imaging1. Introduction; 2. The nD case; 3. The 1D Case; 4. The 2D Case; 5. The 3D Case: The Spherically Symmetrical Fourier Transform; 5.1. Separation of the Green function into Near- and Far-Field parts; 5.2. The Rayleigh-Sommerfeld Diffraction Integral; 5.3. The Field of a Scalar Source or Dipole; 6. The 4D Case; 7. The Projection-Slice Theorem; 8. Applications in Optical Diffraction and Imaging; 9. Conclusions; References; Contents of Volumes 151-187; Index; Color Plate | |
| 520 | |a Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contributions from leading authorities Informs and updates on all the latest developments in the field. | ||
| 650 | 0 | |a Nuclear physics. | |
| 650 | 0 | |a Electrons. | |
| 650 | 6 | |a Physique nucl�eaire. |0 (CaQQLa)201-0002614 | |
| 650 | 6 | |a �Electrons. |0 (CaQQLa)201-0004714 | |
| 650 | 7 | |a nuclear physics. |2 aat |0 (CStmoGRI)aat300054569 | |
| 650 | 7 | |a Electrons |2 fast |0 (OCoLC)fst00907642 | |
| 650 | 7 | |a Nuclear physics |2 fast |0 (OCoLC)fst01040386 | |
| 700 | 1 | |a Hawkes, P. W., |e editor. | |
| 776 | 0 | 8 | |i Print version: |z 9780128022542 |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/book/9780128022542 |z Texto completo |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/bookseries/10765670/188 |z Texto completo |