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Electronics reliability-- calculation and design /

Electronics Reliability-Calculation and Design provides an introduction to the fundamental concepts of reliability. The increasing complexity of electronic equipment has made problems in designing and manufacturing a reliable product more and more difficult. Specific techniques have been developed t...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Dummer, William Arnold (Autor), Griffin, Norman B. (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Oxford : Pergamon Press, 1966.
Colección:Commonwealth and international library. Electrical engineering division.
Temas:
Acceso en línea:Texto completo

MARC

LEADER 00000cam a2200000 i 4500
001 SCIDIR_ocn898071072
003 OCoLC
005 20231120111925.0
006 m o d
007 cr cnu---unuuu
008 141212s1966 enk o 000 0 eng d
040 |a OPELS  |b eng  |e rda  |e pn  |c OPELS  |d OCLCO  |d OCLCF  |d N$T  |d EBLCP  |d DEBSZ  |d MERUC  |d OCLCQ  |d VLY  |d OCLCQ  |d OCLCO  |d OCLCQ  |d OCLCO 
019 |a 894510612 
020 |a 9781483149264 
020 |a 1483149269 
020 |z 9780080114484 
020 |z 0080114482 
035 |a (OCoLC)898071072  |z (OCoLC)894510612 
050 4 |a TK7870 
072 7 |a TEC  |x 009070  |2 bisacsh 
082 0 4 |a 621.381  |2 22 
100 1 |a Dummer, William Arnold,  |e author. 
245 1 0 |a Electronics reliability-- calculation and design /  |c by Geoffrey W.A. Dummer and Norman B. Griffin. 
264 1 |a Oxford :  |b Pergamon Press,  |c 1966. 
300 |a 1 online resource 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 1 |a Commonwealth and International library. Electrical engineering division 
588 0 |a Print version record. 
505 0 |a Front Cover; Electronics Reliability-Calculation and Design; Copyright Page ; Table of Contents; PREFACE; ACKNOWLEDGEMENT; CHAPTER 1. BASIC RELIABILITY THEORY; The Arithmetic Mean; Frequency Distribution; The Median; The Mode; Scatter or Dispersion of Measurements; The Normal and Binomial Distributions; Questions on Chapter 1; CHAPTER 2. CALCULATING EQUIPMENT AND SYSTEM RELIABILITY; The Exponential Law of Reliability; A ""Paper"" Study of Reliability; Prediction of Reliability; Failure Rate; Useful Life; Unreliability; Product Law of Reliability 
505 8 |a Integration of Equipment Reliability into System ReliabilityImportance of the Time Factor; System Prediction from Typical Equipment Failure Rates; Calculation of Life Tests; Determination of Confidence Limits; Confidence Limits based on Standard Deviation; Estimation of the Reliability for Non-exponential Cases; Questions on Chapter 2; CHAPTER 3. SAFETY AND DERATING FACTORS; Reliability through Redundancy; Standby Redundancy; Weight and Reliability Factors; Group Redundancy; Reliability through Derating; Derating of valves; Derating of Semiconductors; Derating of Resistors 
505 8 |a Derating for CapacitorsDerating for Transformers, Inductors, Coils, Magnetic Amplifiers; Derating for Connector Assemblies; Derating for Relays and Switches; Questions on Chapter 3; CHAPTER 4. RELIABILITY IN CONSTRUCTION; General Considerations; Constructional Techniques; Protection of Components and Printed Wiring Boards using Polysulphide Rubber; Back-sealmg of Plugs and Sockets; Encapsulation of Sub-assemblies or Modules; Solderless Wrapped Connections; Environmental Tests of Wrapped Joints; Eliminating Mechanical Stress; Shock and Vibration Mounts 
505 8 |a A Few Practical Considerations of Vibration and Shock MountsCooling of Electronic Equipment; The Use of Liquid Cooling Methods; Insulation and Cooling; The Need for Efficient Sealing; Inert Filling Gases; Questions on Chapter 4; CHAPTER 5. ENVIRONMENTAL EFFECTS ON RELIABILITY; Climatic Conditions; Environmental Stresses; The Environment and its Effect on Electronics; Questions on Chapter 5; CHAPTER 6. RELIABILITY THROUGH MICROELECTRONICS; Thin Film Circuits; Semiconductor Integrated Circuits; Hybrid Integrated Circuits; Reliability Evaluation of Integrated Circuits 
505 8 |a Senuconductor Integrated CircuitsStatistical Data on the Reliability Tests; Questions on Chapter 6; CHAPTER 7. FAILURE RATES FOR ELECTRONIC COMPONENTS; Distribution of Failure Rates; Changes in Failure Rates with Different Vibration Stress Levels; Lowest Recorded Failure Rates; INDEX 
520 |a Electronics Reliability-Calculation and Design provides an introduction to the fundamental concepts of reliability. The increasing complexity of electronic equipment has made problems in designing and manufacturing a reliable product more and more difficult. Specific techniques have been developed that enable designers to integrate reliability into their products, and reliability has become a science in its own right. The book begins with a discussion of basic mathematical and statistical concepts, including arithmetic mean, frequency distribution, median and mode, scatter or dispersion of mea. 
650 0 |a Electronic apparatus and appliances  |x Reliability. 
650 6 |a Appareils �electroniques  |x Fiabilit�e.  |0 (CaQQLa)201-0068176 
650 7 |a TECHNOLOGY & ENGINEERING  |x Mechanical.  |2 bisacsh 
650 7 |a Electronic apparatus and appliances  |x Reliability  |2 fast  |0 (OCoLC)fst00906827 
700 1 |a Griffin, Norman B.,  |e author. 
776 0 8 |i Print version:  |a Dummer, William Arnold.  |t Electronics reliability - calculation and design  |z 9781483149264  |w (OCoLC)59048835 
830 0 |a Commonwealth and international library.  |p Electrical engineering division. 
856 4 0 |u https://sciencedirect.uam.elogim.com/science/book/9780080114484  |z Texto completo