Control of semiconductor interfaces : proceedings of the First International Symposium on Control of Semiconductor Interfaces, Karuizawa, Japan, 8-12 November 1993 /

This book focuses exclusively on control of interfacial properties and structures for semiconductor device applications from the point of view of improving and developing novel electrical properties. The following topics are covered: metal-semiconductors, semiconductor hetero-interfaces, characteriz...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: International Symposium on Control of Semiconductor Interfaces Karuizawa, Japan
Otros Autores: Ohdomari, I. (Iwao) (Editor ), Oshima, M. (Editor ), Hiraki, A. (Akio) (Editor )
Formato: Electrónico Congresos, conferencias eBook
Idioma:Inglés
Publicado: Amsterdam ; New York : Elsevier, �1994.
Temas:
Semiconductors > Junctions > Congresses.
Semiconductors > Junctions.
Semi-conducteurs > Jonctions > Congr�es.
SCIENCE > Physics > Electricity.
SCIENCE > Physics > Electromagnetism.
Halbleitergrenzfl�ache
Kongress
Congress
Conference papers and proceedings.
Actes de congr�es.
Karuizawa (1993)
Acceso en línea:Texto completo
Descripción
Sumario:This book focuses exclusively on control of interfacial properties and structures for semiconductor device applications from the point of view of improving and developing novel electrical properties. The following topics are covered: metal-semiconductors, semiconductor hetero-interfaces, characterization, semiconducting new materials, insulator-semiconductor, interfaces in device, control of interface formation, control of interface properties, contact metallization. A variety of up-to-date research topics such as atomic layer epitaxy, atomic layer passivation, atomic scale characterization in.
Descripción Física:1 online resource (xv, 583 pages) : illustrations
Bibliografía:Includes bibliographical references and indexes.
ISBN:9781483290485
1483290484

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