VLSI reliability /
As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging.
Clasificación: | Libro Electrónico |
---|---|
Autor principal: | Sabnis, Anant G. |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
San Diego :
Academic Press,
1990.
|
Colección: | VLSI electronics ;
v. 22. |
Temas: | |
Acceso en línea: | Texto completo Texto completo |
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