VLSI reliability /
As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging.
Clasificación: | Libro Electrónico |
---|---|
Autor principal: | |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
San Diego :
Academic Press,
1990.
|
Colección: | VLSI electronics ;
v. 22. |
Temas: | |
Acceso en línea: | Texto completo Texto completo |
MARC
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082 | 0 | 4 | |a 621.39/5 |2 22 |
100 | 1 | |a Sabnis, Anant G. | |
245 | 1 | 0 | |a VLSI reliability / |c Anant G. Sabnis. |
264 | 1 | |a San Diego : |b Academic Press, |c 1990. | |
300 | |a 1 online resource (xiii, 207 pages) : |b illustrations | ||
336 | |a text |b txt |2 rdacontent | ||
337 | |a computer |b c |2 rdamedia | ||
338 | |a online resource |b cr |2 rdacarrier | ||
490 | 1 | |a VLSI electronics ; |v volume 22 | |
504 | |a Includes bibliographical references and index. | ||
520 | |a As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging. | ||
588 | 0 | |a Print version record. | |
650 | 0 | |a Integrated circuits |x Very large scale integration |x Reliability. | |
650 | 6 | |a Circuits int�egr�es �a tr�es grande �echelle |0 (CaQQLa)201-0117255 |x Fiabilit�e. |0 (CaQQLa)201-0379337 | |
650 | 7 | |a Integrated circuits |x Very large scale integration |x Reliability |2 fast |0 (OCoLC)fst00975615 | |
650 | 7 | |a Fiabilit�e. |2 ram | |
650 | 7 | |a Circuits int�egr�es �a tr�es grande �echelle. |2 ram | |
776 | 0 | 8 | |i Print version: |a Sabnis, Anant G. |t VLSI reliability |z 0122341228 |w (DLC) 89017892 |w (OCoLC)20320304 |
830 | 0 | |a VLSI electronics ; |v v. 22. | |
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856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/bookseries/07367031/22 |z Texto completo |