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VLSI reliability /

As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging.

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Sabnis, Anant G.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: San Diego : Academic Press, 1990.
Colección:VLSI electronics ; v. 22.
Temas:
Acceso en línea:Texto completo
Texto completo

MARC

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490 1 |a VLSI electronics ;  |v volume 22 
504 |a Includes bibliographical references and index. 
520 |a As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging. 
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