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VLSI reliability /
As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging.
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
San Diego :
Academic Press,
1990.
|
| Colección: | VLSI electronics ;
v. 22. |
| Temas: | |
| Acceso en línea: | Texto completo Texto completo |
MARC
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| 100 | 1 | |a Sabnis, Anant G. | |
| 245 | 1 | 0 | |a VLSI reliability / |c Anant G. Sabnis. |
| 264 | 1 | |a San Diego : |b Academic Press, |c 1990. | |
| 300 | |a 1 online resource (xiii, 207 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
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| 490 | 1 | |a VLSI electronics ; |v volume 22 | |
| 504 | |a Includes bibliographical references and index. | ||
| 520 | |a As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging. | ||
| 588 | 0 | |a Print version record. | |
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