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Surface and interface effects in VLSI /
Surface and Interface Effects in VLSI.
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Orlando :
Academic Press,
1985.
|
| Colección: | VLSI electronics ;
v. 10. |
| Temas: | |
| Acceso en línea: | Texto completo Texto completo |
MARC
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| 003 | OCoLC | ||
| 005 | 20231120111837.0 | ||
| 006 | m o d | ||
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| 008 | 141027s1985 flua ob 001 0 eng d | ||
| 010 | |z 84019122 | ||
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| 019 | |a 897652059 |a 1359403675 | ||
| 020 | |a 9781483217765 |q (electronic bk.) | ||
| 020 | |a 1483217760 |q (electronic bk.) | ||
| 020 | |z 0122341104 | ||
| 020 | |z 9780122341106 | ||
| 035 | |a (OCoLC)893872890 |z (OCoLC)897652059 |z (OCoLC)1359403675 | ||
| 050 | 4 | |a TK7874 |b .V56 vol. 10eb | |
| 072 | 7 | |a TEC |x 009070 |2 bisacsh | |
| 082 | 0 | 4 | |a 621.3819/5835 |2 22 |
| 245 | 0 | 0 | |a Surface and interface effects in VLSI / |c edited by Norman G. Einspruch, Robert S. Bauer. |
| 264 | 1 | |a Orlando : |b Academic Press, |c 1985. | |
| 300 | |a 1 online resource (xii, 383 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 1 | |a VLSI electronics ; |v volume 10 | |
| 504 | |a Includes bibliographical references and index. | ||
| 588 | 0 | |a Print version record. | |
| 505 | 0 | |a Front Cover; Surface and Interface Effects in VLSI; Copyright Page; Table of Contents; List of Contributors; Preface; Part A: Introduction; Chapter 1. Interfaces and Devices; I. INTRODUCTION; II. ELECTRICAL PROPERTIES OF INTERFACES; III. STRUCTURE OF INTERFACES; IV. REPRODUCIBILITY AND STABILITY; V. SUMMARY AND PROGNOSIS; ACKNOWLEDGMENT; REFERENCES; Part B: Structure; Chapter 2. Characterization ofthe Si -- SiO2 Interface; I. INTRODUCTION; II. HISTORICAL BACKGROUND; III. OXIDATION AND DIFFUSION; IV. INTERFACE MORPHOLOGY; V. INTERFACE TRAPS; VI. THEORETICAL MODELS; VII. CONCLUSIONS. | |
| 505 | 8 | |a ACKNOWLEDGMENTSREFERENCES; Chapter 3. Fundamental Studies of Interfaces: The Unified Defect Model and Its Application to GaAs Integrated Circuits; I. INTRODUCTION; II. NEW EXPERIMENTAL TECHNIQUES TO STUDY SURFACES AND INTERFACES ON AN ATOMIC SCALE: SYNCHROTRON RADIATION; III. STRATEGY USED IN THIS WORK; IV. THE UNIFIED DEFECT MODEL FOR III-V INTERFACES AND ITS ORIGIN; V. Ill-V TERNARY AND QUATERNARY ALLOYS; VII. OHMIC CONTACTS; VIII. CHEMISTRY AND INTERMIXING AT III -- V SEMICONDUCTOR-METAL INTERFACES; IX. OTHER APPLICATIONS TO VLSI DEVICES; X. SUMMARY AND CONCLUSIONS; ACKNOWLEDGMENTS. | |
| 505 | 8 | |a VI. THE GaAs SCHOTTKY BARRIERVII. CHANNEL-SUBSTRATE INTERFACE; VIII. OHMIC CONTACTS; IX. DIELECTRIC III-V COMPOUND SEMICONDUCTOR INTERFACES; X. SURFACE AND INTERFACIAL PROPERTIES OF TERNARY AND QUATERNARY III-V ALLOYS; XI. INSTABILITIES IN MISFET; XII. AFTERTHOUGHTS; REFERENCES; Chapter 6. The Role of Boundary Conditions in Near- and Submicrometer-Length Gallium Arsenide Structures; I. INTRODUCTION; II. TRANSPORT THROUGH MOMENT OF THE BOLTZMANN TRANSPORT EQUATION; III. SOLUTION OF THE GOVERNING EQUATIONS; IV. Conclusions; ACKNOWLEDGMENTS; REFERENCES. | |
| 505 | 8 | |a APPENDIX. DIMENSIONLESS EQUATIONS USED IN THE NUMERICAL SIMULATIONSChapter 7. Carrier Transport at the Si -- SiO2 Interface; List of Symbols; I. INTRODUCTION; II. SCALING; III. CARRIER VELOCITY MEASUREMENTS; IV. A MODEL FOR ELECTRON VELOCITY IN SILICON; V. CHARGE PACKET TRANSPORT AND BROADENING; REFERENCES; Index; Contents of Other Volumes. | |
| 520 | |a Surface and Interface Effects in VLSI. | ||
| 650 | 0 | |a Integrated circuits |x Very large scale integration. | |
| 650 | 0 | |a Semiconductors |x Surfaces. | |
| 650 | 6 | |a Circuits int�egr�es �a tr�es grande �echelle. |0 (CaQQLa)201-0117255 | |
| 650 | 6 | |a Semi-conducteurs |0 (CaQQLa)201-0318258 |x Surfaces. |0 (CaQQLa)201-0375383 | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Mechanical. |2 bisacsh | |
| 650 | 7 | |a Integrated circuits |x Very large scale integration |2 fast |0 (OCoLC)fst00975602 | |
| 650 | 7 | |a Semiconductors |x Surfaces |2 fast |0 (OCoLC)fst01112259 | |
| 700 | 1 | |a Einspruch, Norman G. | |
| 700 | 1 | |a Bauer, Robert S. | |
| 776 | 0 | 8 | |i Print version: |t Surface and interface effects in VLSI |z 0122341104 |w (DLC) 84019122 |w (OCoLC)11089540 |
| 830 | 0 | |a VLSI electronics ; |v v. 10. | |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/book/9780122341106 |z Texto completo |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/bookseries/07367031/10 |z Texto completo |