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X-ray diffraction topography /

X-Ray Diffraction Topography presents an elementary treatment of X-ray topography which is comprehensible to the non-specialist. It discusses the development of the principles and application of the subject matter. X-ray topography is the study of crystals which use x-ray diffraction. Some of the to...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Tanner, B. K. (Brian Keith) (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Oxford, England : Pergamon Press, 1976.
Edición:First edition.
Colección:International series in the science of the solid state ; v. 10.
Temas:
Acceso en línea:Texto completo
Descripción
Sumario:X-Ray Diffraction Topography presents an elementary treatment of X-ray topography which is comprehensible to the non-specialist. It discusses the development of the principles and application of the subject matter. X-ray topography is the study of crystals which use x-ray diffraction. Some of the topics covered in the book are the basic dynamical x-ray diffraction theory, the Berg-Barrett method, Lang's method, double crystal methods, the contrast on x-ray topography, and the analysis of crystal defects and distortions. The crystals grown from solution are covered. The naturally occurring cr.
Descripción Física:1 online resource (xiii, 174 pages)
Bibliografía:Includes bibliographical references and index.
ISBN:9781483187686
1483187683
0080196926
9780080196923