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SCIDIR_ocn893681816 |
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OCoLC |
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20231120111830.0 |
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m o d |
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cr cnu---unuuu |
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141024s1990 enk o 000 0 eng d |
040 |
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|a OPELS
|b eng
|e rda
|e pn
|c OPELS
|d E7B
|d EBLCP
|d DEBSZ
|d OCLCQ
|d YDXCP
|d MERUC
|d STF
|d OCLCQ
|d UKAHL
|d OCLCQ
|d OCLCO
|d OCLCQ
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019 |
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|a 898101381
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020 |
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|a 9781483279886
|q (electronic bk.)
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020 |
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|a 148327988X
|q (electronic bk.)
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|z 043490063X
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|z 9780434900633
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|z 0750616016
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020 |
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|z 9780750616010
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035 |
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|a (OCoLC)893681816
|z (OCoLC)898101381
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050 |
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4 |
|a TK7878.4
|b .B75 1990eb
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082 |
0 |
4 |
|a 621.3815/48
|2 23
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100 |
1 |
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|a Brindley, Keith,
|e author.
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245 |
1 |
0 |
|a Modern electronic test equipment /
|c Keith Brindley.
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250 |
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|a Second edition.
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264 |
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1 |
|a Oxford :
|b Heinemann Newnes,
|c 1990.
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300 |
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|a 1 online resource (viii, 261 pages)
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336 |
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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338 |
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|a online resource
|b cr
|2 rdacarrier
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588 |
0 |
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|a Print version record.
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0 |
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|a Front Cover; Modern Electronic Test Equipment; Copyright Page; Table of Contents; Preface; Part One: Equipment and Principles; Chapter 1. Introduction; The past; The present; The future; Explanation of terms; Book layout and description; Chapter 2. Analog meters; General-purpose meters; Specialised analog meters; Chapter 3. Digital meters; Signals and functions; Analog-to-digital conversion; Displays; Advantages of digital meters; Chapter 4. Oscilloscopes; What the oscilloscope displays; The basic oscilloscope; Specifications; Oscilloscope accessories; Equipment accuracy; New developments.
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505 |
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|a Chapter 5. Signal sourcesLow frequency oscillators; Signal generators; Chapter 6. Frequency, time and event counters; High frequency measurement; Low frequency measurement; Equipment and operation; Errors; Chapter 7. Spectrum analysers; Spectrum analyser types; Display characteristics; Equipment specifications and accuracy; Chapter 8. Logic analysers; Features; Main modes of use; Chapter 9. Time domain reflectometers; Metallic time domain reflectometers; Using the metallic time domain reflectometer; Optical time domain reflectometers; Chapter 10. Automatic test equipment.
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505 |
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|a Basic methods of automatic test equipmentTypes of automatic test equipment; Chapter 11. Buses; Bus data communications levels; V24/EIA232; EIA422/EIA423; EIA449; S100; Multibus; PC expansion bus; STE; VMEbus; GPIB; VXIbus; Part Two: Applications and Measurement Techniques; Chapter 12. Measurands and measurement equipment; Aerials or antennas; Amplifiers (untuned); Capacitance; Current; Diode parameters; Distortion; Frequency; Impedance; Inductance; Light; Noise; Optical fibres; Phase; Pulse parameters; Resistance; SCR parameters; Signal-to-noise ratio; Time; Transmission lines.
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|a Appendix 1: DisplaysAnalog displays -- the moving-coil movement; Analog/digital displays -- the cathode ray tube (CRT); Storage CRT; Digital displays; Appendix 2: Optical fibres; Transmission of light; Optical fibre types.
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520 |
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|a Modern Electronic Test Equipment.
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650 |
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0 |
|a Electronic instruments.
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650 |
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6 |
|a Appareils �electroniques.
|0 (CaQQLa)201-0002511
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650 |
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7 |
|a Electronic instruments.
|2 fast
|0 (OCoLC)fst00907299
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776 |
0 |
8 |
|i Print version:
|a Brindley, Keith.
|t Modern electronic test equipment.
|b Second edition
|z 043490063X
|w (OCoLC)21410665
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856 |
4 |
0 |
|u https://sciencedirect.uam.elogim.com/science/book/9780434900633
|z Texto completo
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