Microelectronic systems N3 checkbook /

Microelectronic Systems N3 Checkbook.

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Vears, R. E. (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Oxford : Newnes, 1990.
Colección:Checkbook series.
Temas:
Microelectronics > Problems, exercises, etc.
Micro�electronique > Probl�emes et exercices.
TECHNOLOGY & ENGINEERING > Mechanical.
Microelectronics
Problems and Exercises
exercise books.
Problems and exercises
Problems and exercises.
Probl�emes et exercices.
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Front Cover; Microelectronic Systems N3 Checkbook; Copyright Page; Table of Contents; Notes to readers; Preface; Chapter 1. Microcomputer bus systems; A MAIN POINTS CONCERNED WITH MICROCOMPUTER BUS SYSTEMS; B WORKED PROBLEMS ON MICROCOMPUTER BUS SYSTEMS; C FURTHER PROBLEMS ON MICROCOMPUTER BUS SYSTEMS; Chapter 2. Interrupts; A MAIN POINTS CONCERNED WITH INTERRUPTS; B WORKED PROBLEMS ON INTERRUPTS; C FURTHER PROBLEMS ON INTERRUPTS; Chapter 3. Logic families; A MAIN POINTS CONCERNED WITH LOGIC FAMILIES; B WORKED PROBLEMS ON LOGIC FAMILIES; C FURTHER PROBLEMS ON LOGIC FAMILIES.
  • Chapter 4. Semiconductor memoriesA MAIN POINTS CONCERNED WITH SEMICONDUCTOR MEMORIES; B WORKED PROBLEMS ON SEMICONDUCTOR MEMORIES; C FURTHER PROBLEMS ON SEMICONDUCTOR MEMORIES; Chapter 5. Interfacing devices; A MAIN POINTS CONCERNED WJTH INTERFACING DEVICES; B WORKED PROBLEMS ON INTERFACING DEVICES; C FURTHER PROBLEMS ON INTERFACING DEVICES; Chapter 6. Assembly language programs; A MAIN POINTS CONCERNED WITH ASSEMBLY LANGUAGE PROGRAMS; B WORKED PROBLEMS ON ASSEMBLY LANGUAGE PROGRAMS; C FURTHER PROBLEMS ON ASSEMBLY LANGUAGE PROGRAMS; Chapter 7. Signal degradation.
  • A MAIN POINTS CONCERNED WITH SIGNAL DEGRADATIONB WORKED PROBLEMS ON SIGNAL DEGRADATION; C FURTHER PROBLEMS ON SIGNAL DEGRADATION; Appendix: Instruction sets for the 6502, Z80 and 6800 microprocessors; Index.

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