Hybrid microcircuit reliability data /
Hybrid Microcircuit Reliability Data provides test and operational data on the hybrid device in both highly summarized and detailed format. Organized into five sections, this book begins with a comparison of hybrid device users' experienced failure rate with predicted failure rate. Subsequent c...
Clasificación: | Libro Electrónico |
---|---|
Autor Corporativo: | IIT Research Institute |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
Oxford ; New York :
Pergamon Press,
1976.
|
Temas: | |
Acceso en línea: | Texto completo |
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