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Hybrid microcircuit reliability data /
Hybrid Microcircuit Reliability Data provides test and operational data on the hybrid device in both highly summarized and detailed format. Organized into five sections, this book begins with a comparison of hybrid device users' experienced failure rate with predicted failure rate. Subsequent c...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor Corporativo: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Oxford ; New York :
Pergamon Press,
1976.
|
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 001 | SCIDIR_ocn881847531 | ||
| 003 | OCoLC | ||
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| 008 | 140627s1976 enk o 000 0 eng d | ||
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| 019 | |a 894790916 |a 899001606 |a 948744312 | ||
| 020 | |a 9781483138275 |q (electronic bk.) | ||
| 020 | |a 1483138275 |q (electronic bk.) | ||
| 020 | |z 0080205356 | ||
| 020 | |z 9780080205359 | ||
| 035 | |a (OCoLC)881847531 |z (OCoLC)894790916 |z (OCoLC)899001606 |z (OCoLC)948744312 | ||
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| 088 | |a 75029637 | ||
| 110 | 2 | |a IIT Research Institute. | |
| 245 | 1 | 0 | |a Hybrid microcircuit reliability data / |c prepared by IIT Research Institute. |
| 264 | 1 | |a Oxford ; |a New York : |b Pergamon Press, |c 1976. | |
| 300 | |a 1 online resource (208 pages) | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 588 | 0 | |a Print version record. | |
| 505 | 0 | |a Front Cover ; Hybrid Microcircuit Reliability Data; Copyright Page; Table of Contents; INTRODUCTION; SECTION 1. EXPERIENCED vs PREDICTED FAILURE RATES; SECTION 2. SCREENING SUMMARY; SECTION 3. FAILURE CLASSIFICATIONS; SECTION 4. CROSS REFERENCE INDEX; SECTION 5. DETAILED TEST DATA TABULATION; APPENDIX; HYBRID MICROCIRCUIT DESCRIPTOR CODE INTERPRETATIONS. | |
| 520 | |a Hybrid Microcircuit Reliability Data provides test and operational data on the hybrid device in both highly summarized and detailed format. Organized into five sections, this book begins with a comparison of hybrid device users' experienced failure rate with predicted failure rate. Subsequent chapters focus on the screening summary for the hybrid devices, as well as the failure classifications involved. A tabulated test data on the device is also shown. This book will provide helpful data for government and industrial use. | ||
| 650 | 0 | |a Hybrid integrated circuits |x Reliability. | |
| 650 | 6 | |a Circuits int�egr�es hybrides |0 (CaQQLa)201-0112469 |x Fiabilit�e. |0 (CaQQLa)201-0379337 | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Mechanical. |2 bisacsh | |
| 650 | 7 | |a Hybrid integrated circuits |x Reliability |2 fast |0 (OCoLC)fst00964521 | |
| 650 | 7 | |a Hybridschaltung |2 gnd |0 (DE-588)4026281-9 | |
| 655 | 7 | |a Datensammlung. |2 swd | |
| 776 | 0 | 8 | |i Print version: |a IIT Research Institute. |t Hybrid microcircuit reliability data |z 0080205356 |w (DLC) 75029637 |w (OCoLC)2159388 |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/book/9780080205359 |z Texto completo |