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Metallurgical microscopy /

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Modin, Helfrid, 1916-, Modin, Sten, 1917- (Autor)
Otros Autores: Kinnane, G. G. (Editor ), Baker, T. J. (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Swedish
Publicado: London : Butterworths, [1973]
Temas:
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Front Cover; Metallurgical Microscopy; Copyright Page ; Table of Contents; Chapter 1. Specimen preparation for macroscopic and microscopic examination; 1.1 Examination of surface structures; 1.2 Preparation of flat section surfaces; 1.3 Etching; Chapter 2. Light-optical microscopy and photography; 2.1 Refraction of light rays in thin lenses; 2.2 The speed of lenses; 2.3 Depth of field and depth of focus; 2.4 Influence of focal length on depth of field; 2.5 Size of negative and focal length; 2.6 Perspective; 2.7 Aperture; 2.8 Lens aberrations; 2.9 The metallurgical microscope.
  • 2.10 Polarised light2.11 Cleaning the various parts of the microscope; 2.12 Checking the microscope objective; 2.13 Immersion oils; 2.14 Photomacrography; 2.15 Choice of metallurgical microscope; Chapter 3. Interferometry and contrast-raising methods; 3.1 Determination and calculation of surface topography using the interference microscope; 3.2 Methods for increasing image contrast; Chapter 4. Microhardness measurement; 4.1 Test conditions; 4.2 Errors in hardness measurements due to specimen preparation; 4.3 Errors in hardness measurements due to faults in the equipment.
  • 4.4 Measuring the size of the indentationChapter 5. Quantitative microscopy; 5.1 Methods; 5.2 Calculation of particle size and number; 5.3 Microscopic methods of inclusion content determination; 5.4 Determination of grain size; Chapter 6. High-temperature microscopy; 6.1 General review; Chapter 7. Electron microscopy; 7.1 Construction, properties and applications of the electron microscope; 7.2 Image formation and interpretation; 7.3 Depth of field and depth of focus; 7.4 Electron diffraction; 7.5 Choice of electron microscope.
  • 7.6 Practical applications of Fresnel diffraction during electron microscopy7.7 Cleaning the electron microscope; 7.8 Replica techniques and extraction of particles; 7.9 Preparation of thin foils; 7.10 Special electron microscopes; Chapter 8. The electron microprobe; 8.1 General review; Chapter 9. Photographic materials; 9.1 General; 9.2 The negative process; 9.3 The positive process; TABLES AND FORMULAE; A1 Specimen preparation for macroscopic and microscopic examination; A2 Crystal structures and optical properties of some commonly-encountered phases.
  • A5 Conversion tables for particle and grain size determinationA7 Tables for assessing electron diffraction patterns and formulae for electrolytes for producing metal foils; A9 Photographic formulae; Index.