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Time-resolved electron diffraction : for chemistry, biology and materials science /
Advances in Imaging & Electron Physics merges two long-running serials-Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at...
| Clasificación: | Libro Electrónico |
|---|---|
| Autores principales: | , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Amsterdam, Netherlands :
Academic Press,
2014.
|
| Edición: | First edition. |
| Colección: | Advances in imaging and electron physics ;
volume 184. |
| Temas: | |
| Acceso en línea: | Texto completo Texto completo |
MARC
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| 003 | OCoLC | ||
| 005 | 20231120111603.0 | ||
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| 072 | 7 | |a SCI |x 019000 |2 bisacsh | |
| 082 | 0 | 4 | |a 502.825 |2 23 |
| 100 | 1 | |a Ischenko, Anatoli A., |e author. | |
| 245 | 1 | 0 | |a Time-resolved electron diffraction : |b for chemistry, biology and materials science / |c Anatoli A. Ischenko, Sergei A. Aseyev. |
| 250 | |a First edition. | ||
| 264 | 1 | |a Amsterdam, Netherlands : |b Academic Press, |c 2014. | |
| 264 | 4 | |c �2014 | |
| 300 | |a 1 online resource (320 pages) : |b illustrations (some color), photographs, graphs | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 1 | |a Advances in imaging and electron physics ; |v volume 184 | |
| 504 | |a Includes bibliographical references at the end of each chapters and index. | ||
| 588 | 0 | |a Online resource; title from PDF title page (ebrary, viewed May 8, 2014). | |
| 505 | 0 | |a Front Cover; EDITOR-IN-CHIEF; Time-Resolved Electron Diffraction: for Chemistry, Biology and MaterialsScience; Copyright; CONTENTS; PREFACE; FOREWORD; FUTURE CONTRIBUTIONS; Chapter 1 -- Theory and Data Analysis in Time-Resolved Electron Diffraction; 1.1 BASIC ASSUMPTIONS AND APPROXIMATIONS; 1.2 ILLUSTRATION OF THE DIFFRACTION SIGNATURES OF EXCITED MOLECULES; 1.3 SIMPLIFIED CUMULANT ANALYSIS; 1.4 COMPLETE CUMULANT ANALYSIS; 1.5 MANIFESTATION OF CHAOTIC NUCLEAR DYNAMICS IN TRED STUDIES; REFERENCES; Chapter 2 -- Structural Dynamics in Isolated Molecules; 2.1 THE DEVELOPMENT OF TRED. | |
| 505 | 8 | |a 2.2 THE TIME DEPENDENCE OF THE INTENSITY OF ELECTRONS SCATTERED BY PHOTOEXCITED MOLECULES2.3 COHERENT NUCLEAR DYNAMICS OF SPATIALLY ORIENTED MOLECULES IN THE LASER FIELD; 2.4 DYNAMICS OF SPECTRALLY INVISIBLE STRUCTURES; CONCLUSION; REFERENCES; Chapter 3 -- Ultrafast Electron Crystallography and Nanocrystallography; 3.1 EXPERIMENTAL SETUPS; 3.2 STRUCTURAL DYNAMICS IN CONDENSED PHASE; 3.3 TIME-RESOLVED ELECTRON NANOCRYSTALLOGRAPHY; CONCLUSION; REFERENCES; Chapter 4 -- Coherent Dynamics of Nuclei and Electrons: Femtosecond and Attosecond Resolution in the TRED Technique; 4.1 EXPERIMENTAL TECHNIQUE. | |
| 505 | 8 | |a 4.2 THEORY4.3 SOLUTION OF THE INVERSE PROBLEM; 4.4 THE DYNAMICS OF THE WAVE PACKETS; 4.5 DYNAMICS OF ELECTRONS-ATTOSECOND TEMPORAL RESOLUTION OF THE TRED; CONCLUSION; REFERENCES; Chapter 5 -- Ultrafast Electron Microscopy; 5.1 TRANSMISSION AND SCANNING ELECTRON MICROSCOPY; 5.2 ULTRAFAST ELECTRON MICROSCOPY; 5.3 EXAMPLES OF INSTRUMENT DESIGNS; 5.4 APPLICATIONS OF TIME-RESOLVED MICROSCOPY; 5.5 FUTURE TRENDS; CONCLUSIONS; REFERENCES; Contents of Volumes 151-183; Volume 151; Volume 152; Volume 153; Volume 154; Volume 155; Volume 156; Volume 157; Volume 158; Volume 159; Volume 160; Volume 161. | |
| 505 | 8 | |a Volume 162Volume 163; Volume 164; Volume 165; Volume 166; Volume 167; Volume 168; Volume 169; Volume 170; Volume 171; Volume 172; Volume 173; Volume 174; Volume 175; Volume 176; Volume 177; Volume 178; Volume 179; Volume 180; Volume 181; Volume 182; Volume 183; INDEX; Color Plates. | |
| 520 | |a Advances in Imaging & Electron Physics merges two long-running serials-Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contributions from leading authorities Informs and updates on all the lat. | ||
| 650 | 0 | |a Electrons |x Diffraction. | |
| 650 | 6 | |a �Electrons |x Diffraction. |0 (CaQQLa)201-0022015 | |
| 650 | 7 | |a electron diffraction. |2 aat |0 (CStmoGRI)aat300227274 | |
| 650 | 7 | |a SCIENCE |x Earth Sciences |x General. |2 bisacsh | |
| 650 | 7 | |a Electrons |x Diffraction |2 fast |0 (OCoLC)fst00907646 | |
| 700 | 1 | |a Aseyev, Sergei A., |e author. | |
| 776 | 0 | 8 | |i Print version: |z 9780128001455 |
| 830 | 0 | |a Advances in imaging and electron physics ; |v volume 184. | |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/book/9780128001455 |z Texto completo |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/bookseries/10765670/184 |z Texto completo |