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High-speed analog-to-digital conversion /

This book covers the theory and applications of high-speed analog-to-digital conversion. An analog-to-digital converter takes real-world inputs (such as visual images, temperature readings, and rates of speed) and transforms them into digital form for processing by computer. This book discusses the...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Demler, Michael J.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: San Diego : Academic Press, �1991.
Temas:
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Front Cover; High-Speed Analog-to-Digital Conversion; Copyright Page; Dedication; Table of Contents; Preface; Chapter 1. A/D Converter Architectures; Type I: Serial A/Ds; Type II: Parallel A/Ds; Type III: Subranging A/Ds; Chapter 2. Looking Inside Flash A/D Converter ICs; Design of CMOS Flash A/Ds; Design of Bipolar Flash A/Ds; Error Sources in Flash A/Ds; Input Capacitance and Settling Time; Input Impedance and Frequency Response; Slew-Rate Limitations and Large-Signal Bandwidth; Spurious Codes, Metastable States, and Encoders; Chapter 3. Modeling Error Sources: High-Speed A/D Specifications.
  • Static A/D Performance ParametersDynamic A/D Performance Parameters; Chapter 4. Support Circuits for High-Speed A/Ds; Reference Circuits; Offset and Gain Adjustments; Linearity Trimming; Using Track/Hold Circuits on Input Signals; Applying Buffers to Drive the A/D's Input; Output Demultiplexing; Complete, Single-Package Flash A/D Solutions; Chapter 5. Flash A/D Applications; Burst Mode Sampling; One-Shot Sampling; Stacking Flash A/Ds to Double Resolution; Piecewise and Nonlinear Transfer Characteristics; Oversampling for Increased Effective Resolution.
  • Reference Multiplication for Mixing and Gain ControlPing-Pong Configuration to Double Conversion Rate; Subranging A/Ds; Chapter 6. Test Methods for High-Speed A/D Converters; Static Linearity Tests; Dynamic Linearity Tests; Envelope and Beat Frequency Tests; FFT Testing; Aperture Errors-Locked Histograms; Noise-Power Ratio Test; Differential Phase and Gain Measurements; Bibliography; Index.