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Characterization of semiconductor heterostructures and nanostructures.
Characterization of Semiconductor Heterostructures and Nanostructures is structured so that each chapter is devoted to a specific characterization technique used in the understanding of the properties (structural, physical, chemical, electrical etc.) of semiconductor quantum wells and superlattices....
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Amsterdam ; London :
Elsevier Science,
2013.
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| Edición: | Second edition / |
| Temas: | |
| Acceso en línea: | Texto completo |
Tabla de Contenidos:
- Front Cover; Characterization of Semiconductor Heterostructures and Nanostructures; Copyright; Dedication; Contents; Preface; Contributors; Chapter 1
- Introduction: The InterdisciplinaryNature of and Nanotechnologyand Its Need to Exploit FrontierCharacterization Techniques; 1. THE SCIENTIFIC AND EDITORIAL BOOMING OF NANOTECHNOLOGY IN THE NEW MILLENNIUM; 2. HETEROSTRUCTURES AND NANOSTRUCTURES: DEFINITION AND APPLICATIONS, FROM OPTOELECTRONIC TO CATALYSIS; 3. DYNAMIC INTERPLAY AMONG GROWTH/SYNTHESIS TECHNIQUES, THEORETICAL MODELING AND CHARACTERIZATION TECHNIQUES IN THE DESIGN AND ...
- 4. PURPOSES OF THE BOOK AND CHAPTERS LAYOUTREFERENCES; Chapter 2
- Ab initio Studies of Structural and Electronic Properties; 1. INTRODUCTION; 2. BASIC MODELS FOR BAND ALIGNMENTS; 3. COMPUTATIONAL APPROACH; 4. BAND OFFSETS; 5. DESIGNING HETEROSTRUCTURES AND ENGINEERING BAND OFFSETS; 6. ELECTRONIC STATES; 7. COMPLEX HETEROSTRUCTURES FOR ADVANCED APPLICATIONS; 8. SUMMARY AND FUTURE PERSPECTIVES; ACKNOWLEDGMENTS; REFERENCES AND NOTES; Chapter 3
- Strain and Composition Determination in Semiconductor Heterostructures by High-Resolution X-ray Diffraction; 1. INTRODUCTION
- 2. LATTICE-MISMATCHED AND PSEUDOMORPHIC HETEROSTRUCTURES3. X-RAY DIFFRACTION PROFILES OF SEMICONDUCTOR HETEROSTRUCTURES; 4. DETERMINATION OF THE COMPOSITION OF SEMICONDUCTOR ALLOY HETEROSTRUCTURES; 5. STRAIN RELEASE IN SEMICONDUCTOR HETEROSTRUCTURES; 6. EXPERIMENTAL RESULTS; 7. SUMMARY AND FUTURE PERSPECTIVES; REFERENCES; Chapter 4
- Nanostructures Observed by Surface Sensitive X-Ray Scattering and Highly Focused Beams; 1. INTRODUCTION; 2. EXPERIMENTAL SETUPS; 3. SCIENTIFIC BACKGROUND FOR GRAZING INCIDENCE X-RAY TECHNIQUES ON NANOSTRUCTURES
- 4. EXAMPLES OF GRAZING INCIDENCE TECHNIQUES APPLIED TO NANOSTRUCTURES5. FOCUSED X-RAYS APPLIED TO THE STUDY OF INDIVIDUAL NANOSTRUCTURES; 6. SUMMARY AND FUTURE PERSPECTIVE; REFERENCES; Chapter 5
- Small-Angle X-ray Scattering for the Study of Nanostructures and Nanostructured Materials; 1. INTRODUCTION; 2. THEORY OF SAXS; 3. APPLICATION OF SAXS TECHNIQUE; ACKNOWLEDGMENTS; REFERENCES; Chapter 6
- Local Structure of Bulk and Nanocrystalline Semiconductors Using Total Scattering Methods; 1. INTRODUCTION; 2. THE TOTAL SCATTERING PDF METHOD
- 3. EXAMPLE: MOTIONAL CORRELATIONS IN BULK CRYSTALLINE SEMICONDUCTORS4. EXAMPLE: DISORDER DUE TO ALLOYING IN BULK SEMICONDUCTOR ALLOYS; 5. EXAMPLE: NANOSCALE FLUCTUATIONS IN PURE BULK SEMICONDUCTORS; 6. EXAMPLE: STRUCTURE, DEFECTS, STRAIN, AND SIZE IN SEMICONDUCTOR NPS; 7. SUMMARY AND PERSPECTIVES ON THE FUTURE; REFERENCES; Chapter 7
- X-Ray Absorption Fine Structure in the Study of Semiconductor Heterostructures and Nanostructures; 1. INTRODUCTION TO X-RAY ABSORPTION SPECTROSCOPY FOR LOCAL STRUCTURAL STUDIES; 2. DETECTION SCHEMES AND EXPERIMENTAL SET-UPS RELEVANT FOR SEMICONDUCTOR RESEARCH