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Neutron and x-ray microscopy. Part 1 /

This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Cremer, Jay Theodore, Jr
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Amsterdam ; Boston : Elsevier/Academic Press, 2012.
Edición:1st ed.
Colección:Advances in imaging and electron physics ; v. 172.
Temas:
Acceso en línea:Texto completo
Descripción
Sumario:This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application. Key features: * Contributions from leading authorities * Informs and updates on all the latest developments in the field.
Notas:Title from PDF title page (viewed on July 27, 2012).
Descripción Física:1 online resource.
Bibliografía:Includes bibliographical references and index.
ISBN:9780123978141
0123978149
9780123944221
0123944228