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Advances in imaging and electron physics. Volume 170.
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...
| Clasificación: | Libro Electrónico |
|---|---|
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Oxford :
Academic,
2012.
|
| Temas: | |
| Acceso en línea: | Texto completo Texto completo |
Tabla de Contenidos:
- Precession Electron Diffraction / A.S. Eggeman and P.A. Midgley
- Scanning Helium Ion Microscopy / R. Hill, J.A. Notte, and L. Scipioni
- Signal reconstruction algorithm based on a single intensity in the Fresnel domain / Hone-Ene Hwang, Pin Han
- Electron Microscopy Studies on Magnetic L10 FePd Nanoparticles / Kazuhisa Sato, Toyohiko J. Konno, Yoshihiko Hirotsu
- Fundamental aspects of Near Field Emission Scanning Electron Microscopy / D.A. Zanin, H. Cabrera, L. De Pietro, M. Pikulski, M. Goldmann, U. Ramsperger, D. Pescia, J.P. Xanthakis.