Cargando…
Theory of intense beams of charged particles /
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Amsterdam :
Academic Press,
2011.
|
| Colección: | Advances in imaging and electron physics ;
v. 166 |
| Temas: | |
| Acceso en línea: | Texto completo |
| Sumario: | Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians. |
|---|---|
| Descripción Física: | 1 online resource (xviii, 734 pages) : illustrations. |
| Bibliografía: | Includes bibliographical references and index. |
| ISBN: | 9780123813107 0123813107 |