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Advances in imaging and electron physics. Volume 167 /
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Amsterdam :
Elsevier,
2011.
|
| Edición: | 1st ed. |
| Colección: | Advances in imaging and electron physics,
v. 167 |
| Temas: | |
| Acceso en línea: | Texto completo Texto completo |
Tabla de Contenidos:
- Front Cover; Advances in Imaging and Electron Physics; Copyright; Table of Contents; Preface; Contributors; Future Contributions; Chapter 1. A History of Cameca (1954-2009); 1. Genealogy of Cameca; 2. From Radio-Cin�ema to Cameca (1954); 3. The MS46, First Microprobe Designed at Cameca (1964); 4. Launching the SMI 300 (1968); 5. The Adult Age (1975); 6. Taking Wing (1987); 7. Predominance of SIMS (1990-2000); 8. Star Dusts and Fab Dusts (2000); 9. Ametek and the Atom Probe (2007); 10. Epilogue; 11 Appendices; References.