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Advances in imaging and electron physics. Volume 167 /

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Hawkes, P. W.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Amsterdam : Elsevier, 2011.
Edición:1st ed.
Colección:Advances in imaging and electron physics, v. 167
Temas:
Acceso en línea:Texto completo
Texto completo

MARC

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245 0 0 |a Advances in imaging and electron physics.  |n Volume 167 /  |c edited by Peter W. Hawkes. 
250 |a 1st ed. 
260 |a Amsterdam :  |b Elsevier,  |c 2011. 
300 |a 1 online resource (xiv, 345 pages, 8 unnumbered pages of plates) :  |b illustrations (some color). 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 0 |a Advances in imaging and electron physics,  |x 1076-5670 ;  |v v. 167 
504 |a Includes bibliographical references and index. 
588 0 |a Print version record. 
520 |a Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians. 
505 0 |a Front Cover; Advances in Imaging and Electron Physics; Copyright; Table of Contents; Preface; Contributors; Future Contributions; Chapter 1. A History of Cameca (1954-2009); 1. Genealogy of Cameca; 2. From Radio-Cin�ema to Cameca (1954); 3. The MS46, First Microprobe Designed at Cameca (1964); 4. Launching the SMI 300 (1968); 5. The Adult Age (1975); 6. Taking Wing (1987); 7. Predominance of SIMS (1990-2000); 8. Star Dusts and Fab Dusts (2000); 9. Ametek and the Atom Probe (2007); 10. Epilogue; 11 Appendices; References. 
546 |a English. 
650 0 |a Electrons. 
650 0 |a Imaging systems. 
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650 6 |a Imagerie (Technique)  |0 (CaQQLa)201-0013575 
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650 7 |a Electrons  |2 fast  |0 (OCoLC)fst00907642 
650 7 |a Imaging systems  |2 fast  |0 (OCoLC)fst00967605 
700 1 |a Hawkes, P. W. 
776 0 8 |i Print version:  |z 9780123859853 
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