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Advances in imaging and electron physics. Volume 167 /

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Hawkes, P. W.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Amsterdam : Elsevier, 2011.
Edición:1st ed.
Colección:Advances in imaging and electron physics, v. 167
Temas:
Acceso en línea:Texto completo
Texto completo
Descripción
Sumario:Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians.
Descripción Física:1 online resource (xiv, 345 pages, 8 unnumbered pages of plates) : illustrations (some color).
Bibliografía:Includes bibliographical references and index.
ISBN:9780123859860
0123859867
9780123859853
0123859859
1283164221
9781283164221
9786613164223
6613164224
ISSN:1076-5670 ;