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Optical characterization of real surfaces and films /
This new volume of the highly respected Physics of Thin Films Serial discusses inhomogeneity in real films and surfaces. The volume, guest-edited by K. Vedam, follows the growth of thin films both from the surface of the substrate, and from the atomic level, layer by layer. The text features coverag...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Boston :
Academic Press,
1994.
|
| Colección: | Physics of thin films ;
v. 19 |
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 020 | |a 0125330197 |q (electronic bk.) | ||
| 020 | |a 9780125330190 |q (electronic bk.) | ||
| 035 | |a (OCoLC)707421478 | ||
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| 050 | 4 | |a QC1 |b .P5885 v.19 | |
| 082 | 0 | 4 | |a 530.82 |b P578, v.19 |
| 245 | 0 | 0 | |a Optical characterization of real surfaces and films / |c guest volume editor, K. Vedam. |
| 260 | |a Boston : |b Academic Press, |c 1994. | ||
| 300 | |a 1 online resource (xv, 328 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 0 | |a Physics of thin films ; |v v. 19 | |
| 504 | |a Includes bibliographical references and indexes. | ||
| 506 | |3 Use copy |f Restrictions unspecified |2 star |5 MiAaHDL | ||
| 533 | |a Electronic reproduction. |b [Place of publication not identified] : |c HathiTrust Digital Library, |d 2011. |5 MiAaHDL | ||
| 538 | |a Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. |u http://purl.oclc.org/DLF/benchrepro0212 |5 MiAaHDL | ||
| 583 | 1 | |a digitized |c 2011 |h HathiTrust Digital Library |l committed to preserve |2 pda |5 MiAaHDL | |
| 588 | 0 | |a Print version record. | |
| 520 | |a This new volume of the highly respected Physics of Thin Films Serial discusses inhomogeneity in real films and surfaces. The volume, guest-edited by K. Vedam, follows the growth of thin films both from the surface of the substrate, and from the atomic level, layer by layer. The text features coverage of Real-Time Spectroscopic Ellipsometry (RTSE) and Reflectance Anisotropy (RA), two major breakthrough optical techniques used to characterize real time and insitu films and surfaces. In six insightful chapters, the contributors assess the impact of these techniques, their strengths and limitations, and their potential for further development. | ||
| 650 | 0 | |a Thin films. | |
| 650 | 6 | |a Couches minces. |0 (CaQQLa)201-0035883 | |
| 650 | 7 | |a Thin films. |2 fast |0 (OCoLC)fst01150018 | |
| 700 | 1 | |a Vedam, K. | |
| 776 | 0 | 8 | |i Print version: |t Optical characterization of real surfaces and films. |d Boston : Academic Press, 1994 |w (OCoLC)31698495 |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/book/9780125330190 |z Texto completo |