Advances in imaging and electron physics. Vol. 165 /

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Hawkes, Peter W.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: San Diego, CA : Academic Press, �2011.
Temas:
Optoelectronic devices.
Optical data processing.
Dispositifs opto�electroniques.
Traitement optique de l'information.
TECHNOLOGY & ENGINEERING > Imaging Systems.
Acceso en línea:Texto completo

MARC

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245 0 0 |a Advances in imaging and electron physics.  |n Vol. 165 /  |c edited by Peter W. Hawkes. 
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520 |a Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians. 
505 0 |a Front Cover; Advances in Imaging and Electron Physics; Copyright; Table of Contents; Preface; Contributors; Future Contributions; Chapter 1. Two-Dimensional Fourier Transforms in Polar Coordinates; 1. Introduction; 2. Hankel Transform; 3. The Connection Between the 2D Fourier and Hankel Transforms; 4. The Dirac Delta Function and its Transform; 5. The Complex Exponential and its Transform; 6. Multiplication; 7. Spatial Shift; 8. Full Two-Dimensional Convolution; 9. Special Case: Spatial Shift of Radially Symmetric Functions; 10. Special Case: 2D Convolution of Two Radially Symmetric Functions 
505 8 |a 11. Special Case: Convolution of a Radially Symmetric Function with a Nonsymmetric Function12. Circular (Angular) Convolution; 13. Radial Convolution; 14. Parseval Relationships; 15. The Laplacian; 16. Application to the Helmholtz Equation; 17. Summary and Conclusions; References; Chapter 2. Superluminal, Subluminal, and Negative Velocities in Free-Space Electromagnetic Propagation; 1. Introduction; 2. One Failed Demonstration; 3. Causality, Compatibility, Continuity, and Gauge Fixing; 4. Time-Domain Radiation Formula; 5. Explanation of Near-Field Superluminal Velocities 
505 8 |a 6. Locally Negative Velocities7. Negative Power Flow; 8. Energy Velocity; 9. Conclusions; References; Chapter 3. Chromatic Aberration Correction: The Next Step in Electron Microscopy; 1. Introduction; 2. A Brief History of Aberration Correction; 3. Minimizing or Correcting Chromatic Aberration?; 4. Benefits of Cc Correction; 5. Is Cc Correction Worthwhile?; 6. Conclusions; Acknowledgments; References; Chapter 4. Methods for Vectorial Analysis and Imaging in High-Resolution Laser Microscopy; 1. Introduction; 2. Description of the Problem 
505 8 |a 3. Methods of Approximations for Linearly Polarized Laser Beams4. Methods of Approximations for Radially Polarized Laser Beams; 5. Conclusions; References; Chapter 5. Image Hierarchy in Gaussian Scale Space; 1. Introduction; 2. Basics of Scale Space; 3. Scale-Space Hierarchy; 4. Scale-Space Tree; 5. Scale-Space Properties of Figure-Flow Curves; 6. Combinatorial Structure of Scale-Space Singular Points; 7. Hierarchy of Temporal Image Sequence; 8. Segment Hierarchy; 9. Scale-Space Analysis of Point Cloud; 10. Digital Scale-Space Analysis; 11. Summary and Conclusion; Acknowledgments; References 
505 8 |a Chapter 6. The Theory of the Boundary Diffraction Wave1. Introduction; 2. Improved Diffraction Theory of Kirchhoff; 3. Line Integral Reduction of Surface Integrals; 4. Conclusions; References; Chapter 7. History and Solution of the Phase Problem in the Theory of Structure Determination of Crystals from X-Ray Diffraction Measurements; 1. Introduction; 2. Approximate Methods of Solution of the Phase Problem; 3. Review of Elements of Coherence Theory; 4. Solution of the Phase Problem; Appendix A; Appendix B; Acknowledgments; References; Contents of Volumes 151-164; Index; Color Plate 
650 0 |a Optoelectronic devices. 
650 0 |a Optical data processing. 
650 6 |a Dispositifs opto�electroniques.  |0 (CaQQLa)201-0012482 
650 6 |a Traitement optique de l'information.  |0 (CaQQLa)201-0023313 
650 7 |a TECHNOLOGY & ENGINEERING  |x Imaging Systems.  |2 bisacsh 
650 7 |a Optical data processing.  |2 fast  |0 (OCoLC)fst01046675 
650 7 |a Optoelectronic devices.  |2 fast  |0 (OCoLC)fst01046908 
700 1 |a Hawkes, Peter W. 
776 0 8 |i Print version:  |t Advances in imaging and electron physics Vol. 165.  |d San Diego, CA : Academic Press, �2011  |z 9780123858610  |w (OCoLC)694063014 
856 4 0 |u https://sciencedirect.uam.elogim.com/science/book/9780123858610  |z Texto completo 

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