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Advances in imaging and electron physics. Volume 164 /
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...
| Clasificación: | Libro Electrónico |
|---|---|
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Amsterdam :
Academic Press,
2010.
|
| Colección: | Advances in imaging and electron physics ;
164 |
| Temas: | |
| Acceso en línea: | Texto completo Texto completo |
Tabla de Contenidos:
- Front Cover; Advances in Imaging and Electron Physics; Copyright Page; Contents; Preface; Contributors; Future Contributions; Chapter 1: Magnetolithography: From the Bottom-Up Route to HighThroughput; 1. Introduction; 2. The Magnetolithography Method; 3. Patterning of Non-Flat Surfaces; 4. Summary and Future Perspective; Acknowledgments; References; Chapter 2: The Optics of Spatial Coherence Wavelets; 1. Introduction; 2. Basic Concepts and Mathematical Formalism; 3. Interference and Diffraction with Scalar Wavelets; 4. Tensor Wavelets and Electromagnetic Fields; Acknowledgments; References
- Chapter 3: Common Diffraction Integral Calculation Based on a Fast Fourier Transform Algorithm1. Introduction; 2. Relation Between Discrete Fourier Transform and Fourier Transform; 3. Fast Fourier Transform of Fresnel Diffraction; 4. Numerical Integration of Classic Diffraction; 5. The Collins Formula and Its Inverse Operation; 6. Discussion and Conclusion; References; Chapter 4: A Generalized Approach to Describe the Interference Contrast and the Phase Contrast Method; 1. Introduction; 2. The Interferometric Phase Contrast; 3. General Perspective of the Phase Contrast Method; 4. Conclusion