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Cold field emission and the scanning transmission electron microscope /

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Hawkes, P. W.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Amsterdam ; Boston : Academic Press, 2009.
Colección:Advances in imaging and electron physics ; v. 159.
Temas:
Acceso en línea:Texto completo
Tabla de Contenidos:
  • The work of Albert Victor Crewe on the scanning transmission electron microscope and related topics / A.V. Crewe
  • A review of the cold-field electron cathode / L.W. Swanson and G.A. Schwind
  • History of the STEM at Brookhaven National Laboratory / Joseph S. Wall, Martha N. Simon, and James F. Hainfeld
  • Hitachi's development of cold field emission scanning transmission electron microscopes / Hiromi Inada [and others]
  • Two commercial STEMs: the Siemens ST100F and the AEI STEM-1 / P.W. Hawkes
  • A history of vacuum generators' 100-kV scanning transmission electron microscope / Ian R.M. Wardell and Peter E. Bovey
  • Development of the 300-kV vacuum generator STEM (1985-1996) / H.S. von Harrach
  • On the high-voltage STEM project in Toulouse (MEBATH) / Bernard Jouffrey
  • Scanning transmission electron microscopy: biological applications / Andreas Engel
  • STEM at Cambridge University: reminiscences and reflections from the 1950s and 1960s / K.C.A. Smith.