Advances in imaging and electron physics. Volume 162 /

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Hawkes, P. W.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Amsterdam : Academic Press, 2010.
Edición:1st ed.
Colección:Advances in imaging and electron physics,
Temas:
Electronics.
Image processing.
Electrons.
�Electronique.
Traitement d'images.
�Electrons.
electronic engineering.
image processing.
SCIENCE > Physics > Electromagnetism.
SCIENCE > Physics > Electricity.
Electronics
Electrons
Image processing
Acceso en línea:Texto completo
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Tabla de Contenidos:
  • Font Cover; Advances in Imaging and Electron Physics; Copyright Page; Contents; Preface; Contributors; Future Contributions; Chapter 1: Energy Filtered X-Ray Photoemission Electron Microscopy; Chapter 2: Image Contrast in Aberration-Corrected Scanning Confocal Electron Microscopy; Chapter 3: New Dimensions for Field Emission: Effects of Structure in the Emitting Surface; Chapter 4: Conductivity Imaging and Generalized Radon Transform: A Review; Chapter 5: Comparison of Color Demosaicing Methods; Contents of Volumes 151-161; Index; Color Plates.

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