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Advances in imaging and electron physics. Volume 162 /

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Hawkes, P. W.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Amsterdam : Academic Press, 2010.
Edición:1st ed.
Colección:Advances in imaging and electron physics,
Temas:
Acceso en línea:Texto completo
Texto completo
Descripción
Sumario:Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry expert.
Descripción Física:1 online resource (xiv, 275 pages, 8 unnumbered pages of plates) : illustrations (some color)
Bibliografía:Includes bibliographical references and index.
ISBN:9780123813176
0123813174
9780123813169
0123813166
1282738038
9781282738034
9786612738036
6612738030
ISSN:1076-5670