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Modern metallography
| Clasificación: | Libro Electrónico |
|---|---|
| Autores principales: | , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Oxford, New York,
Pergamon Press
[1966]
|
| Edición: | [1st ed.]. |
| Colección: | Commonwealth and international library. Metallurgy division.
|
| Temas: | |
| Acceso en línea: | Texto completo |
Tabla de Contenidos:
- Front Cover; Modern Metallography; Copyright Page; Table of Contents; PREFACE; CHAPTER 1. REFLECTED LIGHT MICROSCOPY; Introduction; Specimen preparation; The reflected light microscope; Defects of lenses; Methods of increasing the resolving power of an objective; Examples of the contrast observed with reflected light; Suggestions for further reading; CHAPTER 2. HIGH TEMPERATURE MICROSCOPY; Introduction; Long working distance objectives; Typical hot-stage experiments; Suggestions for further reading; CHAPTER 3. SURFACE TOPOGRAPHY; The importance of surface topography observations.
- Oblique illuminationOpaque stop and phase contrast; Interferometry; Examples of surface topography; Suggestions for further reading; CHAPTER 4. THE POLARIZING MICROSCOPE; Polarized light; Examination of anisotropic surfaces; Other uses of polarized light microscopy; Suggestions for further reading; CHAPTER 5. X-RAY METALLOGRAPHY; Introduction; White and characteristic radiation; The Laue conditions; The Bragg law; The structure factor; The Laue method and orientation determination; Powder method and the accurate measurement of lattice parameters; Appendix to Chapter V.
- The reciprocal lattice and the reflection sphereVector notation; Diffraction; Suggestions for further reading; CHAPTER 6. SPECIALIZED X-RAY DIFFRACTION TECHNIQUES; Introduction; Preferred orientation; Wire textures; Sheet textures; Small-angle X-ray scattering; Micro-probe analyser; The observation of dislocations by X-ray diffraction contrast; Suggestions for further reading; CHAPTER 7. ELECTRON MICROSCOPY
- I ELECTRON MICROSCOPE; Electron wavelength; The electron microscope; The electron gun and condenser lens system; Specimen assembly; Lens defects; Control of focusing and magnification.
- Bright- and dark-field imagesSelected area diffraction; Resolution; Recording the image; Microscope attachments; Preparation of specimens; Replica techniques; Thin metal foil techniques; Suggestions for further reading; CHAPTER 8. ELECTRON MICROSCOPY
- II CONTRAST THEORY; Introduction; Diffraction of electrons by perfect crystals; Electron diffraction by an imperfect crystal; Suggestions for further reading; CHAPTER 9. ELECTRON MICROSCOPY
- III INTERPRETATION; Introduction; Analysis of selected area diffraction patterns; Interpretation of additional features on S.A.D. patterns.
- Indexing crystallographic features on micrographsContrast from dislocations and the g.b analysis; Stacking fault contrast and the displacement vector; Measurement of the stacking fault energy; Nature of prismatic dislocation loops; Dislocation densities; Precipitation phenomena; Heating-stage experiments; Cooling-stage experiments; Suggestions for further reading; CHAPTER 10. METALLOGRAPHY AT THE ATOMIC LEVEL; Field-ion microscope; Applications; Neutron diffraction; Suggestions for further reading; INDEX.