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20231120111616.0 |
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101112s1966 enka ob 001 0 eng d |
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|a OCLCE
|b eng
|e pn
|c OCLCE
|d OCLCQ
|d OPELS
|d OCLCF
|d N$T
|d E7B
|d EBLCP
|d DEBSZ
|d YDXCP
|d OCLCQ
|d UAB
|d OCLCO
|d MERUC
|d OCLCQ
|d OCLCO
|d OCLCQ
|d INARC
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|d OCLCQ
|d OCLCO
|d OCLCQ
|d OCLCO
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|a 624376974
|a 881727950
|a 896795561
|a 974617570
|a 974671000
|a 1150849392
|a 1162580244
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| 020 |
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|a 9781483180946
|q (electronic bk.)
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|a 1483180948
|q (electronic bk.)
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| 020 |
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|z 0080115705
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|z 9780080115702
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|a (OCoLC)681155777
|z (OCoLC)624376974
|z (OCoLC)881727950
|z (OCoLC)896795561
|z (OCoLC)974617570
|z (OCoLC)974671000
|z (OCoLC)1150849392
|z (OCoLC)1162580244
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| 042 |
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|a dlr
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| 050 |
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4 |
|a TN690
|b .S559 1966
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|a TEC
|x 023000
|2 bisacsh
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| 082 |
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|a 669.95
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| 100 |
1 |
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|a Smallman, R. E.
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| 245 |
1 |
0 |
|a Modern metallography
|c by R.E. Smallman and K.H.G. Ashbee.
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| 250 |
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|a [1st ed.].
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| 260 |
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|a Oxford,
|a New York,
|b Pergamon Press
|c [1966]
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| 300 |
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|a 1 online resource (ix, 211 pages)
|b illustrations
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| 336 |
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|a text
|b txt
|2 rdacontent
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| 337 |
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|a computer
|b c
|2 rdamedia
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| 338 |
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|a online resource
|b cr
|2 rdacarrier
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| 490 |
1 |
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|a The Commonwealth and International Library. Metallurgy Division
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| 506 |
|
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|3 Use copy
|f Restrictions unspecified
|2 star
|5 MiAaHDL
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| 533 |
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|a Electronic reproduction.
|b [Place of publication not identified] :
|c HathiTrust Digital Library,
|d 2010.
|5 MiAaHDL
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| 538 |
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|a Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
|u http://purl.oclc.org/DLF/benchrepro0212
|5 MiAaHDL
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| 583 |
1 |
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|a digitized
|c 2010
|h HathiTrust Digital Library
|l committed to preserve
|2 pda
|5 MiAaHDL
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| 588 |
0 |
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|a Print version record.
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| 505 |
0 |
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|a Front Cover; Modern Metallography; Copyright Page; Table of Contents; PREFACE; CHAPTER 1. REFLECTED LIGHT MICROSCOPY; Introduction; Specimen preparation; The reflected light microscope; Defects of lenses; Methods of increasing the resolving power of an objective; Examples of the contrast observed with reflected light; Suggestions for further reading; CHAPTER 2. HIGH TEMPERATURE MICROSCOPY; Introduction; Long working distance objectives; Typical hot-stage experiments; Suggestions for further reading; CHAPTER 3. SURFACE TOPOGRAPHY; The importance of surface topography observations.
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| 505 |
8 |
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|a Oblique illuminationOpaque stop and phase contrast; Interferometry; Examples of surface topography; Suggestions for further reading; CHAPTER 4. THE POLARIZING MICROSCOPE; Polarized light; Examination of anisotropic surfaces; Other uses of polarized light microscopy; Suggestions for further reading; CHAPTER 5. X-RAY METALLOGRAPHY; Introduction; White and characteristic radiation; The Laue conditions; The Bragg law; The structure factor; The Laue method and orientation determination; Powder method and the accurate measurement of lattice parameters; Appendix to Chapter V.
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| 505 |
8 |
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|a The reciprocal lattice and the reflection sphereVector notation; Diffraction; Suggestions for further reading; CHAPTER 6. SPECIALIZED X-RAY DIFFRACTION TECHNIQUES; Introduction; Preferred orientation; Wire textures; Sheet textures; Small-angle X-ray scattering; Micro-probe analyser; The observation of dislocations by X-ray diffraction contrast; Suggestions for further reading; CHAPTER 7. ELECTRON MICROSCOPY -- I ELECTRON MICROSCOPE; Electron wavelength; The electron microscope; The electron gun and condenser lens system; Specimen assembly; Lens defects; Control of focusing and magnification.
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| 505 |
8 |
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|a Bright- and dark-field imagesSelected area diffraction; Resolution; Recording the image; Microscope attachments; Preparation of specimens; Replica techniques; Thin metal foil techniques; Suggestions for further reading; CHAPTER 8. ELECTRON MICROSCOPY -- II CONTRAST THEORY; Introduction; Diffraction of electrons by perfect crystals; Electron diffraction by an imperfect crystal; Suggestions for further reading; CHAPTER 9. ELECTRON MICROSCOPY -- III INTERPRETATION; Introduction; Analysis of selected area diffraction patterns; Interpretation of additional features on S.A.D. patterns.
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| 505 |
8 |
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|a Indexing crystallographic features on micrographsContrast from dislocations and the g.b analysis; Stacking fault contrast and the displacement vector; Measurement of the stacking fault energy; Nature of prismatic dislocation loops; Dislocation densities; Precipitation phenomena; Heating-stage experiments; Cooling-stage experiments; Suggestions for further reading; CHAPTER 10. METALLOGRAPHY AT THE ATOMIC LEVEL; Field-ion microscope; Applications; Neutron diffraction; Suggestions for further reading; INDEX.
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| 504 |
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|a Includes bibliographical references at the end of each chapters and index.
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| 546 |
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|a English.
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| 650 |
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0 |
|a Metallography.
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| 650 |
|
6 |
|a M�etallographie.
|0 (CaQQLa)201-0042622
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| 650 |
|
7 |
|a metallography.
|2 aat
|0 (CStmoGRI)aat300226182
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| 650 |
|
7 |
|a TECHNOLOGY & ENGINEERING
|x Metallurgy.
|2 bisacsh
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| 650 |
|
7 |
|a Metallography
|2 fast
|0 (OCoLC)fst01017922
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| 650 |
|
7 |
|a Metallographie
|2 gnd
|0 (DE-588)4169614-1
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| 700 |
1 |
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|a Ashbee, K. H. G.,
|e author.
|
| 776 |
0 |
8 |
|i Print version:
|a Smallman, R.E.
|t Modern metallography.
|b [1st ed.].
|d Oxford, New York, Pergamon Press [1966]
|w (DLC) 65027384
|w (OCoLC)1337563
|
| 830 |
|
0 |
|a Commonwealth and international library.
|p Metallurgy division.
|
| 856 |
4 |
0 |
|u https://sciencedirect.uam.elogim.com/science/book/9780080115702
|z Texto completo
|
