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The physics of SiO₂ and its interfaces : proceedings of the International Topical Conference on the Physics of Si0₂ and Its Interfaces, held at the IBM Thomas J. Watson Research Center, Yorktown Heights, New York, March 22-24, 1978 /

Detalles Bibliográficos
Clasificación:	Libro Electrónico
Autor Corporativo:	International Topical Conference on the Physics of SiO₂ and Its Interfaces Yorktown Heights, N.Y.
Otros Autores:	Pantelides, Sokrates T.
Formato:	Electrónico Congresos, conferencias eBook
Idioma:	Inglés
Publicado:	New York : Pergamon Press, �1978.
Temas:	Silica > Congresses. Surfaces (Physics) > Congresses. Surface chemistry > Congresses. Silice > Congr�es. Surfaces (Physique) > Congr�es. Chimie des surfaces > Congr�es. Silica. Surface chemistry. Surfaces (Physics) Congress Conference papers and proceedings. Actes de congr�es.
Acceso en línea:	Texto completo

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