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Diffusion in crystalline solids /
DIFFUSION IN CRYSTALLINE SOLIDS.
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Orlando, Fla. :
Academic Press,
1984.
|
| Colección: | Materials science and technology (New York, N.Y.)
|
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 245 | 0 | 0 | |a Diffusion in crystalline solids / |c edited by Graeme E. Murch, Arthur S. Nowick. |
| 260 | |a Orlando, Fla. : |b Academic Press, |c 1984. | ||
| 300 | |a 1 online resource (xv, 482 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
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| 490 | 1 | |a Materials science and technology series | |
| 504 | |a Includes bibliographical references and index. | ||
| 506 | |3 Use copy |f Restrictions unspecified |2 star |5 MiAaHDL | ||
| 533 | |a Electronic reproduction. |b [Place of publication not identified] : |c HathiTrust Digital Library, |d 2010. |5 MiAaHDL | ||
| 538 | |a Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. |u http://purl.oclc.org/DLF/benchrepro0212 |5 MiAaHDL | ||
| 583 | 1 | |a digitized |c 2010 |h HathiTrust Digital Library |l committed to preserve |2 pda |5 MiAaHDL | |
| 588 | 0 | |a Print version record. | |
| 505 | 0 | |a Front Cover; Diffusion in Crystalline Solids; Copyright Page; Table of Contents; List of Contributors; Foreword; Preface; Chapter 1. The Measurement of Tracer Diffusion Coefficients in Solids; I. Introduction; II. Preparation of Diffusion Samples; III. Annealing of Diffusion Samples; IV. Sectioning and Microsectioning; V. Counting of Radioactive Sections; VI. Determination of D from a Penetration Plot; VII. Conclusions; Acknowledgments; References; Chapter 2. Diffusion in Silicon and Germanium; I. Introduction; II. Basic Features of Bulk Diffusion in Crystalline Solids | |
| 505 | 8 | |a III. Self-Diffusion and Related PhenomenaIV. Survey of Foreign-Atom Diffusion; V. Oxidation-Influenced Diffusion of Group III and Group V Elements in Silicon; VI. A Barrier against Vacancy-Interstitial Recombination; VII. Diffusion of Group III and Group V Elements and Its Dependence on Doping; VIII. Anomalous Diffusion Phenomena; IX. Substitutional-Interstitial Interchange Diffusion and Application to Gold and Nickel in Silicon and to Copper in Germanium; X. Concluding Remarks; Acknowledgments; References; Chapter 3. Atom Transport in Oxides of the Fluorite Structure; I. Introduction | |
| 505 | 8 | |a II. Diffusion StudiesIII. Conductivity and Relaxation; IV. Comparison of Ionic Conductivity and Oxygen Diffusion; Acknowledgments; References; Chapter 4. Tracer Diffusion in Concentrated Alloys; I. Introduction; II. Theoretical Background; III. Empirical Rules; IV. Theoretical Considerations of the Kinetics of Diffusion in Random Alloys; V. Tracer Diffusion Experiments in Primary (Terminal) Phases; VI. Theoretical Considerations of Diffusion in Ordered Structures; VII. Tracer Diffusion Experiments in Intermediate Phases; VIII. Conclusions; Acknowledgments; References | |
| 505 | 8 | |a II. The Diffusion SpectrumIII. Present Knowledge of the Structure of Grain Boundaries and Their Line and Point Defects; IV. Review of Experiments Relevant to the Atom Jumping Mechanism in Boundaries; V. Model for Atom Jumping in Boundaries; VI. Influence of Boundary Structure on Boundary Diffusion; VII. Diffusion along Migrating Boundaries; VIII. Model for Grain Boundaries as Point Defect Sources and Sinks and Comparison with Experimental Observations; IX. Conclusions; Acknowledgments; References; Chapter 7. Simulation of Diffusion Kinetics with the Monte Carlo Method; I. Introduction | |
| 520 | |a DIFFUSION IN CRYSTALLINE SOLIDS. | ||
| 546 | |a English. | ||
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| 776 | 0 | 8 | |i Print version: |t Diffusion in crystalline solids. |d Orlando, Fla. : Academic Press, 1984 |w (DLC) 84000355 |w (OCoLC)10404285 |
| 830 | 0 | |a Materials science and technology (New York, N.Y.) | |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/book/9780125226622 |z Texto completo |