Advances in imaging and electron physics /

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Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics a...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Hawkes, P. W.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: San Diego : Academic Press, 1999.
Colección:Advances in imaging and electron physics ; 111
Temas:
Imaging systems.
Electrons.
Imagerie (Technique)
�Electrons.
Electrons
Imaging systems
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Front Cover
  • Advances in Imaging and Electron Pahysics, Volume 106
  • Copyright Page
  • Contents
  • Contributors
  • Preface
  • Chapter 1. Effects of Radiation Damage on Scientific Charge Coupled Devices
  • I. Introduction
  • II. Device Structure and Operation
  • III. Radiation Damage
  • IV. Dark Current
  • V. Charge Transfer Efficiency
  • VI. Read Noise
  • VII. Conclusions
  • References
  • Chapter 2. CAD Using Green's Functions and Finite Elements and Comparison to Experimental Structures for Inhomogeneous Microstrip Circulators
  • I. Introduction to CAD for Microstrip Circulators.
  • II. Ferrite Physical and Chemical Attributes Relevant to Microstrip Circulator Material Selection
  • III. Processing of Ferrite Materials for Microstrip Circulator Structures
  • IV. Microstrip Circulator Considerations for Modeling
  • V. Setup Formulas for Numerical Evalution of Microstrip Circulators
  • VI. Numerical Results and Comparison to Experiment for Microstrip Circulators
  • VII. Conclusions
  • References
  • Chapter 3. Discrete Geometry for Image Processing
  • I. Introduction
  • II. Binary Digital Images
  • III. Digital Topology
  • IV. Discrete Geometry.
  • V. Extensions in the 16-Neighborhood Space
  • VI. Application to Vectorization
  • VII. Conclusion
  • References
  • Chapter 4. Introduction to the Fractional Fourier Transform and Its Applications
  • I. Introduction
  • II. Notation and Definitions
  • III. Fundamental Properties
  • IV. Common Transform Pairs
  • V. Eigenvalues and Eigenfunctions
  • VI. Operational Properties
  • VII. Relation to the Wigner Distribution
  • VIII. Fractional Fourier Domains
  • IX. Differential Equations
  • X. Hyperdifferential Form
  • XI. Digital Simulation of the Transform.
  • XII. Applications to Wave and Beam Propagation
  • XIII. Applications to Signal and Image Processing
  • Acknowledgments
  • References
  • Chapter 5. Confocal Microscopy
  • I. Resolution in Light Microscopy
  • II. Calculating Optical Properties
  • III. Principles of Confocal Microscopy
  • IV. Improving the Axial Resolution
  • V. Nonlinear Imaging
  • VI. Aperture Filters
  • VII. Axial Tomography
  • VIII. Spectral Precision Distance Microscopy
  • IX. Computational Methods
  • X. Spinning Disks
  • XI. Perspectives of Confocal Fluorescence Microscopy
  • References
  • Index.

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