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Advances in imaging and electron physics. Volume 147 /
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
San Diego :
Academic Press,
2007.
|
| Colección: | Advances in imaging and electron physics ;
147 |
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 245 | 0 | 0 | |a Advances in imaging and electron physics. |n Volume 147 / |c edited by Peter W. Hawkes ; [honorary associate editors Tom Mulvey, Benjamin Kazan]. |
| 264 | 1 | |a San Diego : |b Academic Press, |c 2007. | |
| 300 | |a 1 online resource (xvi, 209 pages) : |b illustrations. | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 0 | |a Advances in imaging and electron physics ; |v 147 | |
| 588 | 0 | |a Print version record. | |
| 520 | |a Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. | ||
| 505 | 0 | |a Cover; Copyright page; Contents; Contributors; Preface; Future Contributions; Chapter 1. Scanning Cathodoluminescence Microscopy; I. Introduction; II. Types of Cathodoluminescence Experiments; III. Advances in CL Instrumentation and Theory; IV. Active Fields of Cathodoluminescence Research; V. Other Cathodoluminescence Topics; VI. Summary; References; Chapter 2. Fuzzy Transforms: A Challenge to Conventional Transforms; I. Introduction; II. Residuated Lattice; III. Semilinear Spaces; IV. Spaces of Functions: Fuzzy Sets; V. Fuzzy Transforms in a Semilinear Functional Space | |
| 505 | 8 | |a VI. Inverse F (F)-TransformsVII. Approximation by Inverse F-Transforms; VIII. Fuzzy Transform in a Linear Space; IX. Applications of F-Transform; X. Application of the F-Transform to Image Fusion; XI. Conclusion; References; Index | |
| 546 | |a English. | ||
| 650 | 0 | |a Electronics. | |
| 650 | 0 | |a Imaging systems. | |
| 650 | 0 | |a Electron optics. | |
| 650 | 0 | |a Electron microscopy. | |
| 650 | 2 | |a Electronics |0 (DNLM)D004581 | |
| 650 | 2 | |a Microscopy, Electron |0 (DNLM)D008854 | |
| 650 | 6 | |a �Electronique. |0 (CaQQLa)201-0001759 | |
| 650 | 6 | |a Imagerie (Technique) |0 (CaQQLa)201-0013575 | |
| 650 | 6 | |a Optique �electronique. |0 (CaQQLa)201-0006721 | |
| 650 | 6 | |a Microscopie �electronique. |0 (CaQQLa)201-0066871 | |
| 650 | 7 | |a electron microscopy. |2 aat |0 (CStmoGRI)aat300224955 | |
| 650 | 7 | |a Electron microscopy. |2 fast |0 (OCoLC)fst00906682 | |
| 650 | 7 | |a Electron optics. |2 fast |0 (OCoLC)fst00906693 | |
| 650 | 7 | |a Electronics. |2 fast |0 (OCoLC)fst00907538 | |
| 650 | 7 | |a Imaging systems. |2 fast |0 (OCoLC)fst00967605 | |
| 700 | 1 | |a Hawkes, P. W. | |
| 776 | |z 0-12-373909-8 | ||
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/book/9780123739094 |z Texto completo |