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Advances in imaging and electron physics. Volume 145 /
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
San Diego :
Academic Press,
2007.
|
| Colección: | Advances in imaging and electron physics
|
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 019 | |a 505075332 |a 1162312124 | ||
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| 020 | |a 9780123739070 |q (electronic bk.) | ||
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| 035 | |a (OCoLC)648218920 |z (OCoLC)505075332 |z (OCoLC)1162312124 | ||
| 050 | 4 | |a QC793.5.E62 |b A3 2007eb | |
| 082 | 0 | 4 | |a 537.5/6 |2 22 |
| 245 | 0 | 0 | |a Advances in imaging and electron physics. |n Volume 145 / |c edited by Peter W. Hawkes. |
| 246 | 3 | 0 | |a Imaging and electron physics |
| 260 | |a San Diego : |b Academic Press, |c 2007. | ||
| 300 | |a 1 online resource (xv, 220 pages) : |b illustrations. | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 0 | |a Advances in imaging and electron physics | |
| 504 | |a Includes bibliographical references and index. | ||
| 588 | 0 | |a Print version record. | |
| 520 | |a Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. | ||
| 505 | 0 | |a Cover; Copyright page; Contents; Contributors; Preface; Future Contributions; Chapter 1. Applications of Noncausal Gauss-Markov Random Field Models in Image and Video Processing; I. Introduction; II. Terminology; III. Potential Matrix; IV. Rauch-Tung-Striebel Smoothing for Image Restoration; V. Video Compression; VI. Inversion Algorithms for Block Banded Matrices; VII. Conclusions; References; Chapter 2. Direct Electron Detectors for Electron Microscopy; I. Introduction; II. Detectors-General Introduction; III. Film; IV. CCDs; V. Direct Electron Semiconductor Detectors | |
| 505 | 8 | |a VI. Monte Carlo SimulationsVII. Hybrid Pixel Detectors, Medipix1, and Medipix2; VIII. MAPS Detectors Based on CMOS; XIX. Conclusions; Acknowledgments; References; Chapter 3. Exploring Third-Order Chromatic Aberrations of Electron Lenses with Computer Algebra; I. Introduction; II. Variational Function and Its Approximations; III. Chromatic Perturbation Variational Function and Its Approximations; IV. Analytical Derivation of Third-Order Chromatic Aberration Coefficients; V. Graphical Display of Third-Order Chromatic Aberration Patterns | |
| 505 | 8 | |a VI. Numerical Calculation of Third-Order Chromatic Aberration CoefficientsVII. Conclusions; Acknowledgments; Appendix; References; Chapter 4. Anisotropic Diffusion Partial Differential Equations for Multichannel Image Regularization: Framework and Applications; Preliminary Notations; I. Introduction; II. PDE-Based Smoothing of Multivalued Images: A Review; III. Curvature-Preserving PDEs; IV. Implementation Considerations; V. Applications; VI. Conclusion; Appendix A; Appendix B; Appendix C; References; Index | |
| 546 | |a English. | ||
| 650 | 0 | |a Electronics. | |
| 650 | 0 | |a Imaging systems. | |
| 650 | 0 | |a Electron optics. | |
| 650 | 0 | |a Electron microscopy. | |
| 650 | 2 | |a Electronics |0 (DNLM)D004581 | |
| 650 | 2 | |a Microscopy, Electron |0 (DNLM)D008854 | |
| 650 | 6 | |a �Electronique. |0 (CaQQLa)201-0001759 | |
| 650 | 6 | |a Imagerie (Technique) |0 (CaQQLa)201-0013575 | |
| 650 | 6 | |a Optique �electronique. |0 (CaQQLa)201-0006721 | |
| 650 | 6 | |a Microscopie �electronique. |0 (CaQQLa)201-0066871 | |
| 650 | 7 | |a electron microscopy. |2 aat |0 (CStmoGRI)aat300224955 | |
| 650 | 7 | |a Electron microscopy. |2 fast |0 (OCoLC)fst00906682 | |
| 650 | 7 | |a Electron optics. |2 fast |0 (OCoLC)fst00906693 | |
| 650 | 7 | |a Electronics. |2 fast |0 (OCoLC)fst00907538 | |
| 650 | 7 | |a Imaging systems. |2 fast |0 (OCoLC)fst00967605 | |
| 700 | 1 | |a Hawkes, P. W. | |
| 776 | |z 0-12-373907-1 | ||
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/book/9780123739070 |z Texto completo |