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Advances in imaging and electron physics Volume 153, Aberration-corrected microscopy /

The invention of the electron microscope more than 70 years ago made it possible to visualize a new world, far smaller than anything that could be seen with the traditional microscope. The biologist could study viruses and the components of cells, the materials scientist could study the structure of...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Hawkes, P. W.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Amsterdam ; Boston : Academic Press, 2008.
Edición:1st ed.
Colección:Advances in imaging and electron physics ; v. 153
Temas:
Acceso en línea:Texto completo

MARC

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245 0 0 |a Advances in imaging and electron physics  |n Volume 153,  |p Aberration-corrected microscopy /  |c Peter W. Hawkes. 
246 3 |a Aberration-corrected microscopy 
250 |a 1st ed. 
260 |a Amsterdam ;  |a Boston :  |b Academic Press,  |c 2008. 
300 |a 1 online resource (xix, 538 pages) :  |b illustrations. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 0 |a Advances in imaging and electron physics ;  |v v. 153 
504 |a Includes bibliographical references and index. 
588 0 |a Print version record. 
520 |a The invention of the electron microscope more than 70 years ago made it possible to visualize a new world, far smaller than anything that could be seen with the traditional microscope. The biologist could study viruses and the components of cells, the materials scientist could study the structure of metals and alloys and many other substances, and especially their defects. But even the electron microscope had limits, and truly atomic structure was still too small to be observed directly. The so-called 'limit of resolution' of the microscope was well understood but attempts to use the necessary correctors were unsuccessful until the late 1990s. Such correctors now equip many microscopes in Europe, the USA and Japan and the results are extremely impressive. Moreover, microscopists feel that they are only at the beginning of a new era of subatomic microscopical imaging. In the present volume, we have brought together the principal contributors, instrument designers and microscopists to discuss this topic in depth. * First book on the subject of correctors * Well known contributors from academia and microscope manufacturers * Provides an ideal starting point for preparing funding proposals. 
650 0 |a Optoelectronic devices. 
650 0 |a Optical data processing. 
650 0 |a Transmission electron microscopy. 
650 0 |a Scanning transmission electron microscopy. 
650 0 |a Aberration. 
650 6 |a Dispositifs opto�electroniques.  |0 (CaQQLa)201-0012482 
650 6 |a Traitement optique de l'information.  |0 (CaQQLa)201-0023313 
650 6 |a Microscopie �electronique �a transmission.  |0 (CaQQLa)201-0268470 
650 6 |a Microscopie �electronique �a balayage et �a transmission.  |0 (CaQQLa)201-0306637 
650 6 |a Aberration.  |0 (CaQQLa)201-0008136 
650 7 |a Aberration.  |2 fast  |0 (OCoLC)fst00794369 
650 7 |a Optical data processing.  |2 fast  |0 (OCoLC)fst01046675 
650 7 |a Optoelectronic devices.  |2 fast  |0 (OCoLC)fst01046908 
650 7 |a Scanning transmission electron microscopy.  |2 fast  |0 (OCoLC)fst01106494 
650 7 |a Transmission electron microscopy.  |2 fast  |0 (OCoLC)fst01154860 
700 1 |a Hawkes, P. W. 
856 4 0 |u https://sciencedirect.uam.elogim.com/science/book/9780123742209  |z Texto completo