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Advances in imaging and electron physics Volume 108, Modern map methods in particle beam physics /

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics a...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Berz, M.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: San Diego ; London : Academic Press, �1999.
Colección:Advances in imaging and electron physics.
Temas:
Acceso en línea:Texto completo
Descripción
Sumario:Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Descripción Física:1 online resource (xv, 318 pages) : illustrations.
Bibliografía:Includes bibliographical references and index.
ISBN:0120147505
9780120147502
9786611719036
6611719032
0080577741
9780080577746