|
|
|
|
LEADER |
00000cam a2200000 i 4500 |
001 |
SCIDIR_ocn644880406 |
003 |
OCoLC |
005 |
20231117033200.0 |
006 |
m o d |
007 |
cr bn||||||abp |
007 |
cr bn||||||ada |
008 |
100628s1978 ne af ob 101 0 eng d |
040 |
|
|
|a OCLCE
|b eng
|e pn
|c OCLCE
|d OPELS
|d OCLCO
|d UIU
|d OCLCQ
|d OCLCF
|d UIU
|d OCLCO
|d OCL
|d OCLCO
|d OCLCQ
|d LEAUB
|d LUN
|d OCLCQ
|d OCLCO
|d COM
|d OCLCO
|d OCLCQ
|d OCLCO
|
019 |
|
|
|a 297804654
|
020 |
|
|
|z 9780444851284
|q (v. 1)
|
020 |
|
|
|z 0444851283
|q (v. 1)
|
020 |
|
|
|z 9780444851291
|q (v. 2)
|
020 |
|
|
|z 0444851291
|q (v. 2)
|
020 |
|
|
|z 0444851305
|
020 |
|
|
|z 9780444851307
|
035 |
|
|
|a (OCoLC)644880406
|z (OCoLC)297804654
|
042 |
|
|
|a dlr
|
050 |
|
4 |
|a TA417.23
|b .D54 1978
|
082 |
0 |
4 |
|a 620.1/127
|2 18
|
084 |
|
|
|a 33.61
|2 bcl
|
245 |
0 |
0 |
|a Diffraction and imaging techniques in material science /
|c editors, S. Amelinckx, R. Gevers, J. Van Landuyt.
|
250 |
|
|
|a 2d, rev. ed.
|
260 |
|
|
|a Amsterdam ;
|a New York :
|b North-Holland Pub. Co. :
|b Sole distributors for the U.S.A. and Canada, Elsevier North-Holland,
|c 1978.
|
300 |
|
|
|a 1 online resource (2 volumes (xvii, 847 pages, 1 unnumbered leaf of plates)) :
|b illustrations
|
336 |
|
|
|a text
|b txt
|2 rdacontent
|
337 |
|
|
|a computer
|b c
|2 rdamedia
|
338 |
|
|
|a online resource
|b cr
|2 rdacarrier
|
504 |
|
|
|a Includes bibliographical references and index.
|
505 |
0 |
|
|a v. 1. Electron microscopy.--v. 2. Imaging and diffraction techniques.
|
506 |
|
|
|3 Use copy
|f Restrictions unspecified
|2 star
|5 MiAaHDL
|
533 |
|
|
|a Electronic reproduction.
|b [Place of publication not identified] :
|c HathiTrust Digital Library,
|d 2010.
|5 MiAaHDL
|
538 |
|
|
|a Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
|u http://purl.oclc.org/DLF/benchrepro0212
|5 MiAaHDL
|
583 |
1 |
|
|a digitized
|c 2010
|h HathiTrust Digital Library
|l committed to preserve
|2 pda
|5 MiAaHDL
|
588 |
0 |
|
|a Print version record.
|
650 |
|
0 |
|a Electron microscopy
|v Congresses.
|
650 |
|
0 |
|a Electrons
|x Diffraction
|v Congresses.
|
650 |
|
0 |
|a Imaging systems
|v Congresses.
|
650 |
|
6 |
|a Microscopie �electronique
|0 (CaQQLa)201-0066871
|v Congr�es.
|0 (CaQQLa)201-0378219
|
650 |
|
6 |
|a �Electrons
|0 (CaQQLa)201-0022015
|x Diffraction
|0 (CaQQLa)201-0022015
|v Congr�es.
|0 (CaQQLa)201-0378219
|
650 |
|
6 |
|a Imagerie (Technique)
|0 (CaQQLa)201-0013575
|v Congr�es.
|0 (CaQQLa)201-0378219
|
650 |
|
7 |
|a Electron microscopy
|2 fast
|0 (OCoLC)fst00906682
|
650 |
|
7 |
|a Electrons
|x Diffraction
|2 fast
|0 (OCoLC)fst00907646
|
650 |
|
7 |
|a Imaging systems
|2 fast
|0 (OCoLC)fst00967605
|
650 |
1 |
7 |
|a Elektronenmicroscopie.
|2 gtt
|
650 |
1 |
7 |
|a Afbeeldingen (algemeen)
|2 gtt
|
650 |
|
7 |
|a MICROSC�OPIO ELETR�ONICO (CONGRESSOS)
|2 larpcal
|
653 |
|
|
|a Materials
|a Structure
|a Determination
|a Applications of diffraction
|
653 |
|
|
|a Materials
|a Structure
|a Determination
|a Imaging systems - Conference proceedings
|
655 |
|
2 |
|a Congress
|0 (DNLM)D016423
|
655 |
|
7 |
|a proceedings (reports)
|2 aat
|0 (CStmoGRI)aatgf300027316
|
655 |
|
7 |
|a Conference papers and proceedings
|2 fast
|0 (OCoLC)fst01423772
|
655 |
|
7 |
|a Conference papers and proceedings.
|2 lcgft
|
655 |
|
7 |
|a Actes de congr�es.
|2 rvmgf
|0 (CaQQLa)RVMGF-000001049
|
700 |
1 |
|
|a Amelinckx, S.
|q (Severin)
|
700 |
1 |
|
|a Gevers, R.
|
700 |
1 |
|
|a Landuyt, J. van.
|
711 |
2 |
|
|a International Summer Course on Material Science
|d (1969 :
|c Antwerp, Belgium).
|t Modern diffraction and imaging techniques in material science.
|
776 |
0 |
8 |
|i Print version:
|w (DLC) 78022081
|w (OCoLC)4504580
|
856 |
4 |
0 |
|u https://sciencedirect.uam.elogim.com/science/book/9780444851284
|z Texto completo
|
856 |
4 |
0 |
|u https://sciencedirect.uam.elogim.com/science/book/9780444851291
|z Texto completo
|