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Focusing of charged particles /
Focusing of Charged Particles.
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York :
Academic Press,
1967.
|
| Temas: | |
| Acceso en línea: | Texto completo Texto completo Texto completo |
MARC
| LEADER | 00000cam a2200000 i 4500 | ||
|---|---|---|---|
| 001 | SCIDIR_ocn643887522 | ||
| 003 | OCoLC | ||
| 005 | 20231117033150.0 | ||
| 006 | m o d | ||
| 007 | cr bn||||||abp | ||
| 007 | cr bn||||||ada | ||
| 008 | 100626s1967 nyua ob 000 0 eng d | ||
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| 020 | |a 9781483270616 |q (electronic bk.) | ||
| 020 | |a 1483270610 |q (electronic bk.) | ||
| 020 | |z 9781483231815 |q (v. 1) | ||
| 020 | |z 148323181X |q (v. 1) | ||
| 020 | |z 9780126369021 |q (v. 2) | ||
| 020 | |z 012636902X |q (v. 2) | ||
| 035 | |a (OCoLC)643887522 |z (OCoLC)300507786 |z (OCoLC)654261392 |z (OCoLC)761394097 |z (OCoLC)895431608 |z (OCoLC)974619634 |z (OCoLC)974665808 |z (OCoLC)1149035305 |z (OCoLC)1149055199 | ||
| 042 | |a dlr | ||
| 050 | 4 | |a QC447 |b .F6 | |
| 072 | 7 | |a SCI |x 021000 |2 bisacsh | |
| 072 | 7 | |a SCI |x 022000 |2 bisacsh | |
| 082 | 0 | 4 | |a 537.5/6 |
| 245 | 0 | 0 | |a Focusing of charged particles / |c edited by Albert Septier. |
| 260 | |a New York : |b Academic Press, |c 1967. | ||
| 300 | |a 1 online resource (2 volumes) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 504 | |a Includes bibliographical references. | ||
| 506 | |3 Use copy |f Restrictions unspecified |2 star |5 MiAaHDL | ||
| 533 | |a Electronic reproduction. |b [Place of publication not identified] : |c HathiTrust Digital Library, |d 2010. |5 MiAaHDL | ||
| 538 | |a Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. |u http://purl.oclc.org/DLF/benchrepro0212 |5 MiAaHDL | ||
| 583 | 1 | |a digitized |c 2010 |h HathiTrust Digital Library |l committed to preserve |2 pda |5 MiAaHDL | |
| 588 | 0 | |a Print version record. | |
| 505 | 0 | |a Front Cover; Focusing of Charged Particles; Copyright Page; LIST OF CONTRIBUTORS; EDITORS PREFACE; PREFACE; Table of Contents; CONTENTS OF VOLUME II; Part 1:Potentiah Fields, Trajectories; CHAPTER 1.1. PARTICLES AND FIELDS: FUNDAMENTAL EQUATIONS; 1.1.1. The Electrostatic Field; 1.1.2. The Magnetic Field; 1.1.3. Determination of Trajectory; 1.1.4. Particle Beams; REFERENCES; BIBLIOGRAPHY; CHAPTER 1.2. NUMERICAL SOLUTION OF LAPLACE'S AND POISSONS EQUATIONS AND THE CALCULATION OF ELECTRON TRAJECTORIES AND ELECTRON BEAMS; 1.2.1. Introduction. | |
| 505 | 8 | |a 1.2.2. The Solution of Laplace's and Poisson's Equations1.2.3. The Calculation of Electron Trajectories; 1.2.4. The Calculation of Electron Beams Taking into Account ThermalVelocities; REFERENCES; CHAPTER 1.3. ANALOGICAL METHODS FOR RESOLVING LAPLACE'S AND POISSON'S EQUATIONS; Introduction; 1.3.1. The Electrolytic Plotting Tank; 1.3.2. The Resistance Network; REFERENCES; CHAPTER 1.4. MEASUREMENT OF MAGNETIC FIELDS; 1.4.1. Introduction; 1.4.2. Principles of the Most Usual Methods of Measuring Magnetic Fields; 1.4.3. Measurement of Magnetic Fields. | |
| 505 | 8 | |a 1.4.4. Measurement of the Gradient of Magnetic FieldsREFERENCES; Part 2:Lenses; CHAPTER 2.1. HIGH BRIGHTNESS ELECTRON GUNS; 2.1.1. Introduction; 2.1.2. Electron-Gun Requirements and Limitations; 2.1.3. Cathode Design; 2.1.4. Gun Geometry and Performance; 2.1.5. Practical Design Considerations; REFERENCES; CHAPTER 2.2. ELECTROSTATIC LENSES; 2.2.1. General Properties of Image Formation; 2.2.2. Data of Particular Lenses; 2.2.3. Practical Aspects for the Construction of Electrostatic Lenses; REFERENCES; CHAPTER 2.3. MAGNETIC ELECTRON LENSES; 2.3.1. Introduction. | |
| 505 | 8 | |a 2.3.2. General Properties of Magnetic Lenses2.3.3. Ironless Magnetic Lenses; 2.3.4. Magnetic Lenses of the Electromagnet Type; 2.3.5. Lenses With Permanent Magnets; GENERAL REFERENCES; REFERENCES; CHAPTER 2.4. FOCUSING WITH QUADRUPOLES, DOUBLETS, AND TRIPLETS; 2.4.1. General Properties of Focusing Systems; 2.4.2. The Quadrupole Lens; 2.4.3. The Doublet; 2.4.4. The Triplet; 2.4.5. The Multiplet; 2.4.6. Matching Problems; BIBLIOGRAPHY; CHAPTER 2.5. LENS ABERRATIONS; 2.5.1. Introduction; 2.5.2. Fermat's Principle; Characteristic Functions; Perturbation Theory; 2.5.3. Symmetry. | |
| 505 | 8 | |a 2.5.4. The Aberration CoefficientsREFERENCES; CHAPTER 2.6. ELECTRON MICROPROBES; 2.6.1. Introduction; 2.6.2. General Principles; 2.6.3. Practical Applications; REFERENCES; AUTHOR INDEX; SUBJECT INDEX. | |
| 520 | |a Focusing of Charged Particles. | ||
| 650 | 0 | |a Electron optics. | |
| 650 | 6 | |a Optique �electronique. |0 (CaQQLa)201-0006721 | |
| 650 | 7 | |a SCIENCE |x Physics |x Electricity. |2 bisacsh | |
| 650 | 7 | |a SCIENCE |x Physics |x Electromagnetism. |2 bisacsh | |
| 650 | 7 | |a Electron optics. |2 fast |0 (OCoLC)fst00906693 | |
| 700 | 1 | |a Septier, Albert L., |e editor. | |
| 776 | 0 | 8 | |i Print version: |w (DLC) 67017593 |w (OCoLC)870716 |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/book/9781483231815 |z Texto completo |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/book/9780126369021 |z Texto completo |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/book/9780126369014 |z Texto completo |