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Size effects in thin films /

A complete and comprehensive study of transport phenomena in thin continuous metal films, this book reviews work carried out on external-surface and grain-boundary electron scattering and proposes new theoretical equations for transport properties of these films. It presents a complete theoretical v...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Tellier, C. R. (Colette R.), 1947-
Otros Autores: Tosser, A. J. (Andr�e J.), 1940-
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Amsterdam ; New York : Elsevier, 1982.
Colección:Thin films science and technology ; 2.
Temas:
Acceso en línea:Texto completo
Descripción
Sumario:A complete and comprehensive study of transport phenomena in thin continuous metal films, this book reviews work carried out on external-surface and grain-boundary electron scattering and proposes new theoretical equations for transport properties of these films. It presents a complete theoretical view of the field, and considers imperfection and impurity effects.
Descripción Física:1 online resource (ix, 310 pages) : illustrations
Bibliografía:Includes bibliographical references and indexes.
ISBN:9781483289762
1483289761