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Very high speed integrated circuits : gallium arsenide LSI /

SEMICONDUCTORS & amp; SEMIMETALS V29.

Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Ikoma, Toshiaki, 1941-
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Boston, Mass. : Academic Press, �1990.
Colección:Semiconductors and semimetals ; vol. 29.
Temas:
Acceso en línea:Texto completo
Texto completo

MARC

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245 0 0 |a Very high speed integrated circuits :  |b gallium arsenide LSI /  |c volume editor, Toshiaki Ikoma. 
260 |a Boston, Mass. :  |b Academic Press,  |c �1990. 
300 |a 1 online resource (x, 309 pages) :  |b illustrations 
336 |a text  |b txt  |2 rdacontent 
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490 1 |a Semiconductors and semimetals / edited by R.K. Willardson, A.C. Beer ;  |v v. 29 
504 |a Includes bibliographical references and index. 
506 |3 Use copy  |f Restrictions unspecified  |2 star  |5 MiAaHDL 
533 |a Electronic reproduction.  |b [Place of publication not identified] :  |c HathiTrust Digital Library,  |d 2010.  |5 MiAaHDL 
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505 0 |a Front Cover; Very High Speed Integrated Circuits: Gallium Arsenide LSI; Copyright Page; Contents; List of Contributors; Preface; Chapter 1. Active Layer Formation by Ion Implantation; List of Symbols; I. Introduction; ll. Furnace Annealing; lll. Rapid Thermal Annealing; References; Chapter 2. Focused Ion Beam Implantation Technology; I. Introduction; ll. Implanter; lll. FIB Implants; IV. Compositional Disordering of GaAs-AlGaAs; V. FIB-Doping MBE Growth; VI. Prospect of FIB Technology; References; Chapter 3. Device Fabrication Process Technology; l. Introduction. 
505 8 |a Ll. Fundamental Process Technologieslll. Self-Aligned MESFET Technology; IV. Device Technology Effective for Improving Characteristics in Submicron Gate MESFETs; V. Summary; References; Chapter 4. GaAs LSI Circuit Design; I. Introduction; Il. Device Analysis; lll. FET Model; IV. Other Elements; V. Basic Circuit Configurations; Vl. LSI Design; VII. Testing Technology; VIII. Summary; References; Chapter 5. GaAs LSI Fabrication and Performance; I. Introduction; Il. Characterization of Semi-insulating GaAs Wafers for IC Application. 
505 8 |a Ill. TEG Selection for LSI Fabrication Process and Chip/Wafer LayoutIV. FET Fabrication and Performance for LSls; V. Circuit Elements and Interconnection; VI. Assembly Techniques and Packaging; VII. LSI Fabrication and Performance; VIII. Summary and Future Trends; References; Index; Contents of Previous Volumes. 
520 |a SEMICONDUCTORS & amp; SEMIMETALS V29. 
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650 0 |a Gallium arsenide. 
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650 7 |a Gallium arsenide semiconductors  |2 fast  |0 (OCoLC)fst00937276 
650 7 |a Integrated circuits  |2 fast  |0 (OCoLC)fst00975535 
700 1 |a Ikoma, Toshiaki,  |d 1941- 
776 0 8 |i Print version:  |t Very high speed integrated circuits.  |d Boston, Mass. : Academic Press, �1990  |w (OCoLC)21886910 
830 0 |a Semiconductors and semimetals ;  |v vol. 29. 
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