Analytical techniques for thin films /

Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Tu, K. N. (King-Ning), 1937-, Rosenberg, R.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Boston : Academic Press, �1988.
Colección:Treatise on materials science and technology ; v. 27.
Temas:
Thin films > Technique.
Couches minces > Technique.
Thin films > Technique
Couches minces.
Bombardement ionique > Applications scientifiques.
Faisceaux �electroniques > Applications scientifiques.
Rayons X > Applications scientifiques.
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Submicron structure and microanalysis / K.N. Tu and R. Rosenberg
  • Synchrotron radiation photoemission studies of interfaces / J.H. Weaver
  • Contact x-ray microscopy / R. Feder and D.M. Shinozaki
  • X-ray diffraction analysis of stress and strain in thin films / A. Segmuller and M. Murakami
  • X-ray diffraction analysis of diffusion in thin films / M. Murakami, A. Segmuller, and K.N. Tu
  • ESCA / N. Martensson
  • Cross-sectional transmission electron microscopy of electronic and photonic devices / T.T. Sheng
  • High resolution transmission electron microscopy of surfaces and interfaces / D. Cherns
  • Scanning transmission electron microscopy / P. Batson
  • Rutherford backscattering spectrometry on thin solid films / T.G. Finstad and W.K. Chu
  • Atomic structure and atomic layer compositional analysis of thin solid films using time-of-flight atom-probe field ion microscopy / T.T. Tsong.

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