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SCIDIR_ocn561086111 |
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OCoLC |
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20231117032925.0 |
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m o d |
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cr bn||||||abp |
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cr bn||||||ada |
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100318s1978 nyua ob 001 0 eng d |
040 |
|
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|a OCLCE
|b eng
|e pn
|c OCLCE
|d OCLCQ
|d OPELS
|d E7B
|d OCLCQ
|d IDEBK
|d N$T
|d OCLCF
|d OCLCQ
|d UIU
|d YDXCP
|d OCLCQ
|d LEAUB
|d LUN
|d OCLCQ
|d OCLCO
|d OCLCQ
|
019 |
|
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|a 301302853
|a 609174644
|a 655565115
|a 842266407
|
020 |
|
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|a 9780323154970
|q (electronic bk.)
|
020 |
|
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|a 0323154972
|q (electronic bk.)
|
020 |
|
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|z 9780122413605
|
020 |
|
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|z 0122413601
|
035 |
|
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|a (OCoLC)561086111
|z (OCoLC)301302853
|z (OCoLC)609174644
|z (OCoLC)655565115
|z (OCoLC)842266407
|
042 |
|
|
|a dlr
|
050 |
|
4 |
|a TA418.7
|
072 |
|
7 |
|a TEC
|x 009000
|2 bisacsh
|
072 |
|
7 |
|a TEC
|x 035000
|2 bisacsh
|
082 |
0 |
4 |
|a 620/.0044
|2 18
|
082 |
0 |
4 |
|a 621.36
|
084 |
|
|
|a 33.18
|2 bcl
|
084 |
|
|
|a 50.37
|2 bcl
|
084 |
|
|
|a 51.30
|2 bcl
|
084 |
|
|
|a 52.88
|2 bcl
|
084 |
|
|
|a UH 5680
|2 rvk
|
088 |
|
|
|a 78000206
|
245 |
0 |
0 |
|a Speckle metrology /
|c edited by Robert K. Erf.
|
260 |
|
|
|a New York :
|b Academic Press,
|c 1978.
|
300 |
|
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|a 1 online resource (xiv, 331 pages) :
|b illustrations
|
336 |
|
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|a text
|b txt
|2 rdacontent
|
337 |
|
|
|a computer
|b c
|2 rdamedia
|
338 |
|
|
|a online resource
|b cr
|2 rdacarrier
|
490 |
1 |
|
|a Quantum electronics--principles and applications
|
504 |
|
|
|a Includes bibliographical references and index.
|
506 |
|
|
|3 Use copy
|f Restrictions unspecified
|2 star
|5 MiAaHDL
|
533 |
|
|
|a Electronic reproduction.
|b [Place of publication not identified] :
|c HathiTrust Digital Library,
|d 2010.
|5 MiAaHDL
|
538 |
|
|
|a Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
|u http://purl.oclc.org/DLF/benchrepro0212
|5 MiAaHDL
|
583 |
1 |
|
|a digitized
|c 2010
|h HathiTrust Digital Library
|l committed to preserve
|2 pda
|5 MiAaHDL
|
588 |
0 |
|
|a Print version record.
|
650 |
|
0 |
|a Speckle metrology.
|
650 |
|
6 |
|a Interf�erom�etrie par granularit�e.
|0 (CaQQLa)201-0049322
|
650 |
|
7 |
|a shearography.
|2 aat
|0 (CStmoGRI)aat300391311
|
650 |
|
7 |
|a TECHNOLOGY & ENGINEERING
|x Engineering (General)
|2 bisacsh
|
650 |
|
7 |
|a TECHNOLOGY & ENGINEERING
|x Reference.
|2 bisacsh
|
650 |
|
7 |
|a Speckle metrology.
|2 fast
|0 (OCoLC)fst01432101
|
650 |
|
7 |
|a Laser
|2 gnd
|0 (DE-588)4034610-9
|
650 |
|
7 |
|a Quantenoptik
|2 gnd
|0 (DE-588)4047990-0
|
650 |
|
7 |
|a Speckle-Interferometrie
|2 gnd
|0 (DE-588)4182122-1
|
650 |
|
7 |
|a Granularit�e (optique)
|2 ram
|
650 |
|
7 |
|a Interf�erom�etrie par granularit�e.
|2 ram
|
655 |
|
7 |
|a Speckle-Metrologie.
|2 swd
|
655 |
|
7 |
|a Speckle-Metrology.
|2 swd
|
700 |
1 |
|
|a Erf, Robert K.
|
776 |
0 |
8 |
|i Print version:
|t Speckle metrology.
|d New York : Academic Press, 1978
|w (DLC) 78000206
|w (OCoLC)3948958
|
830 |
|
0 |
|a Quantum electronics--principles and applications.
|
856 |
4 |
0 |
|u https://sciencedirect.uam.elogim.com/science/book/9780122413605
|z Texto completo
|