Fundamental principles of engineering nanometrology /
The principles of engineering metrology applied to the micro- and nanoscale: essential reading for all scientists and engineers involved in the commercialisation of nanotechnology and measurement processes requiring accuracy at the nanoscale. The establishment of common standards will be an essentia...
Clasificación: | Libro Electrónico |
---|---|
Autor principal: | Leach, R. K. |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
Oxford : Amsterdam :
William Andrew ; Elsevier Science,
�2010.
|
Edición: | 1st ed. |
Colección: | Micro & nano technologies.
|
Temas: | |
Acceso en línea: | Texto completo Texto completo |
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