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Atomic force microscopy in process engineering : introduction to AFM for improved processes and products /
Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments and is therefore a critical tool for process en...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Oxford ; Burlington, MA :
Butterworth-Heinemann,
�2009.
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| Edición: | 1st ed. |
| Colección: | Butterworth-Heinemann/IChemE series.
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| Temas: | |
| Acceso en línea: | Texto completo |
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