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Optics of charged particle analyzers /
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Amsterdam ; Boston :
Academic Press,
2009.
|
| Edición: | 1st ed. |
| Colección: | Advances in imaging and electron physics ;
157. |
| Temas: | |
| Acceso en línea: | Texto completo Texto completo |
MARC
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| 020 | |a 9780123747686 |q (electronic bk.) | ||
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| 100 | 1 | |a Yavor, Mikhail. | |
| 245 | 1 | 0 | |a Optics of charged particle analyzers / |c Mikhail Yavor. |
| 250 | |a 1st ed. | ||
| 260 | |a Amsterdam ; |a Boston : |b Academic Press, |c 2009. | ||
| 300 | |a 1 online resource (xxiii, 381 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 1 | |a Advances in imaging and electron physics ; |v v. 157 | |
| 504 | |a Included bibliographical references and index. | ||
| 505 | 0 | |a Charged particles in electromagnetic fields -- Language of aberration expansions in charged particle optics -- Transporting charged particle beams in static fields -- Transporting charged particles in radiofrequency fields -- Static magnetic charged particle analyzers -- Electrostatic energy analyzers -- Mass analyzers with combined electrostatic and magnetic fields -- Time-of-flight mass analyzers -- Radiofrequency mass analyzers. | |
| 588 | 0 | |a Print version record. | |
| 520 | |a Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians. | ||
| 650 | 0 | |a Particles (Nuclear physics) | |
| 650 | 0 | |a Electron optics. | |
| 650 | 0 | |a Nuclear physics |x Instruments. | |
| 650 | 6 | |a Particules (Physique nucl�eaire) |0 (CaQQLa)201-0005652 | |
| 650 | 6 | |a Optique �electronique. |0 (CaQQLa)201-0006721 | |
| 650 | 6 | |a Physique nucl�eaire |x Instruments. |0 (CaQQLa)201-0070839 | |
| 650 | 7 | |a particle physics. |2 aat |0 (CStmoGRI)aat300054565 | |
| 650 | 7 | |a SCIENCE |x Physics |x Nuclear. |2 bisacsh | |
| 650 | 7 | |a SCIENCE |x Physics |x Atomic & Molecular. |2 bisacsh | |
| 650 | 7 | |a Electron optics |2 fast |0 (OCoLC)fst00906693 | |
| 650 | 7 | |a Nuclear physics |x Instruments |2 fast |0 (OCoLC)fst01040399 | |
| 650 | 7 | |a Particles (Nuclear physics) |2 fast |0 (OCoLC)fst01054130 | |
| 776 | 0 | 8 | |i Print version: |a Yavor, Mikhail. |t Optics of charged particle analyzers. |b 1st ed. |d Amsterdam ; Boston : Academic Press, 2009 |z 9780123747686 |w (OCoLC)311788385 |
| 830 | 0 | |a Advances in imaging and electron physics ; |v 157. | |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/book/9780123747686 |z Texto completo |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/bookseries/10765670/157 |z Texto completo |