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Selected problems of computational charged particle optics /
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Amsterdam ; Boston :
Academic Press,
2009.
|
| Edición: | 1st ed. |
| Colección: | Advances in imaging and electron physics ;
v. 155. |
| Temas: | |
| Acceso en línea: | Texto completo Texto completo |
Tabla de Contenidos:
- Integral equations method in electrostatics
- Surface charge singularities near irregular surface points
- Geometry perturbations
- Some aspects of magnetic field simulation
- Aberration approach and the tau-variation technique
- Space charge in charged particle bunches
- General properties of emission-imaging systems
- Static and time-analyzing image tubes with axial symmetry
- Spatial and temporal focusing on photoelectron bunches in time-dependent electric fields.