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Selected problems of computational charged particle optics /
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Amsterdam ; Boston :
Academic Press,
2009.
|
| Edición: | 1st ed. |
| Colección: | Advances in imaging and electron physics ;
v. 155. |
| Temas: | |
| Acceso en línea: | Texto completo Texto completo |
MARC
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| 100 | 1 | |a Greenfield, Dmitry. | |
| 245 | 1 | 0 | |a Selected problems of computational charged particle optics / |c Dmitry Greenfield and Mikhail Monastyrskiy. |
| 250 | |a 1st ed. | ||
| 260 | |a Amsterdam ; |a Boston : |b Academic Press, |c 2009. | ||
| 300 | |a 1 online resource (xviii, 346 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 1 | |a Advances in imaging and electron physics ; |v v. 155 | |
| 504 | |a Includes bibliographical references (pages 333-339) and index. | ||
| 505 | 0 | |a Integral equations method in electrostatics -- Surface charge singularities near irregular surface points -- Geometry perturbations -- Some aspects of magnetic field simulation -- Aberration approach and the tau-variation technique -- Space charge in charged particle bunches -- General properties of emission-imaging systems -- Static and time-analyzing image tubes with axial symmetry -- Spatial and temporal focusing on photoelectron bunches in time-dependent electric fields. | |
| 588 | 0 | |a Print version record. | |
| 520 | |a Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This monograph summarizes the authors' knowledge and experience acquired over many-years in their work on computational charged particle optics. It's main message is that even in this era of powerful computers with a multitude of general-purpose and problem-oriented programs, asymptotic analysis based on perturbation theory remains one of the most effective tools to penetrate deeply into the essence of the problem in question. | ||
| 650 | 0 | |a Electron optics. | |
| 650 | 0 | |a Optical data processing. | |
| 650 | 0 | |a Aberration. | |
| 650 | 6 | |a Optique �electronique. |0 (CaQQLa)201-0006721 | |
| 650 | 6 | |a Traitement optique de l'information. |0 (CaQQLa)201-0023313 | |
| 650 | 6 | |a Aberration. |0 (CaQQLa)201-0008136 | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Imaging Systems. |2 bisacsh | |
| 650 | 7 | |a Aberration |2 fast |0 (OCoLC)fst00794369 | |
| 650 | 7 | |a Electron optics |2 fast |0 (OCoLC)fst00906693 | |
| 650 | 7 | |a Optical data processing |2 fast |0 (OCoLC)fst01046675 | |
| 700 | 1 | |a Monastyrski�i, M. I. |q (Mikhail Il�ich) | |
| 776 | 0 | 8 | |i Print version: |a Greenfield, Dmitry. |t Selected problems of computational charged particle optics. |b 1st ed. |d Amsterdam ; Boston : Academic Press, 2009 |z 9780123747174 |z 0123747171 |w (OCoLC)244420623 |
| 830 | 0 | |a Advances in imaging and electron physics ; |v v. 155. | |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/book/9780123747174 |z Texto completo |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/bookseries/10765670/155 |z Texto completo |