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Selected problems of computational charged particle optics /
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...
| Clasificación: | Libro Electrónico |
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| Autor principal: | |
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Amsterdam ; Boston :
Academic Press,
2009.
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| Edición: | 1st ed. |
| Colección: | Advances in imaging and electron physics ;
v. 155. |
| Temas: | |
| Acceso en línea: | Texto completo Texto completo |
| Sumario: | Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This monograph summarizes the authors' knowledge and experience acquired over many-years in their work on computational charged particle optics. It's main message is that even in this era of powerful computers with a multitude of general-purpose and problem-oriented programs, asymptotic analysis based on perturbation theory remains one of the most effective tools to penetrate deeply into the essence of the problem in question. |
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| Descripción Física: | 1 online resource (xviii, 346 pages) : illustrations |
| Bibliografía: | Includes bibliographical references (pages 333-339) and index. |
| ISBN: | 9780080879697 0080879691 9780123747174 0123747171 1282286498 9781282286498 |